X-Ray Nanoimaging: Instruments and Methods V
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, Cali...
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| Format: | Electronic |
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| Language: | Undetermined |
| Published: |
SPIE / International Society for Optical Engineering
2021.
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| Subjects: | |
| ISBN: | 9781510645165 9781510645172 1510645179 |
| Physical Description: | 1 online resource |
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| Summary: | Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on X-Ray Nanoimaging: Instruments and Methods V held on 1-5 August 2021, San Diego, California, United States. |
|---|---|
| ISBN: | 9781510645165 9781510645172 1510645179 |
| Access: | Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty |
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