Introduction to scanning tunneling microscopy
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic...
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| Main Author | |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Oxford :
Oxford University Press,
2021.
|
| Edition | Third edition. |
| Series | Monographs on the physics and chemistry of materials ;
69. |
| Subjects | |
| Online Access | Full text |
| ISBN | 9780191889905 0191889903 9780192598561 0192598562 9780198856559 0198856555 |
| Physical Description | 1 online resource (lxx, 452 pages) : illustrations |
Cover
Table of Contents:
- Tunneling phenomenon
- Tunneling matrix elements
- Atomic forces
- Atomic forces and tunneling
- Nanometer-scale imaging
- Atomic-scale imaging
- Imaging wavefunctions
- Nanomechanical eects
- Piezoelectric scanner
- Vibration isolation
- Electronics and control
- Mechanical design
- Tip treatment
- Scanning tunneling spectroscopy
- Atomic force microscopy.