Introduction to scanning tunneling microscopy

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic...

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Bibliographic Details
Main Author: Chen, C. Julian, (Author)
Format: eBook
Language: English
Published: Oxford : Oxford University Press, 2021.
Edition: Third edition.
Series: Monographs on the physics and chemistry of materials ; 69.
Subjects:
Scanning tunneling microscopy.
elektronické knihy
electronic books
ISBN: 9780191889905
0191889903
9780192598561
0192598562
9780198856559
0198856555
Physical Description: 1 online resource (lxx, 452 pages) : illustrations

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Table of contents

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020 |a 0191889903  |q (ebook) 
020 |a 9780192598561  |q (electronic bk.) 
020 |a 0192598562  |q (electronic bk.) 
020 |z 9780198856559  |q (hbk.) 
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100 1 |a Chen, C. Julian,  |e author. 
245 1 0 |a Introduction to scanning tunneling microscopy /  |c C. Julian Chen. 
250 |a Third edition. 
264 1 |a Oxford :  |b Oxford University Press,  |c 2021. 
300 |a 1 online resource (lxx, 452 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
336 |a still image  |b sti  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Monographs on the physics and chemistry of materials ;  |v 69 
500 |a This edition also issued in print: 2021. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 8 |a The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. This is a reference book on the topic. 
504 |a Includes bibliographical references and index. 
505 0 |a Tunneling phenomenon -- Tunneling matrix elements -- Atomic forces -- Atomic forces and tunneling -- Nanometer-scale imaging -- Atomic-scale imaging -- Imaging wavefunctions -- Nanomechanical eects -- Piezoelectric scanner -- Vibration isolation -- Electronics and control -- Mechanical design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Scanning tunneling microscopy. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
776 0 8 |i Print version:  |a Chen, C. Julian.  |t Introduction to scanning tunneling microscopy.  |b Third edition.  |d Oxford : Oxford University Press, 2021  |z 9780198856559  |w (OCoLC)1242746902 
830 0 |a Monographs on the physics and chemistry of materials ;  |v 69. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpISTME003/introduction-to-scanning?kpromoter=marc  |y Full text 

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