Cross-layer reliability of computing systems

This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. It is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing sy...

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Bibliographic Details
Other Authors Di Natale, Giorgio (Editor), Gizopoulos, Dimitris (Editor), Di Carlo, Stefano (Editor), Bosio, Alberto (Editor), Canal, Ramon (Editor)
Format Electronic eBook
LanguageEnglish
Published London The Institution of Engineering and Technology 2020
SeriesMaterials, circuits and devices series ; 57.
Subjects
Computer architecture.
Stochastic processes.
elektronické knihy
electronic books
Online AccessFull text
ISBN1785617982
9781785617980
9781785617973
1785617974
Physical Description1 online resource (xi, 315 pages) illustrations

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Table of Contents:
  • Technological layer / Antonio Rubio and Ramon Canal
  • Design techniques to improve the resilience of computing systems : logic layer / Lorena Anghel and Michael Nicolaidis
  • Design techniques to improve the resilience of computing systems : architectural layer / Aviral Shrivastava, Kyoungwoo Lee, Hwisoo So, Jinhyo Jung, and Prudhvi Gali
  • Design techniques to improve the resilience of computing systems : software layer / Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Matteo Sonza Reorda, and Josie E. Rodriguez Condia
  • Cross-layer resilience / Eric Cheng and Subhasish Mitra
  • Physical stress / Fernando Fernandes dos Santos, Fabio Benevenuti, Gennaro Rodrigues, Fernanda Kastensmidt, and Paolo Rech
  • Soft error modeling and simulation / Mojtaba Ebrahimi and Mehdi Tahoori
  • Microarchitecture-level reliability assessment of multi-core processors / Athanasios Chatzidimitriou and Dimitris Gizopoulos
  • Fault injection at the instruction set architecture (ISA) level / Karthik Pattabiraman and Guanpeng Li
  • Analytical modeling for crosslayer resiliency / Arijit Biswas
  • Stochastic methods / Alessandro Savino, Alessandro Vallero, and Stefano Di Carlo

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