rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Characterisation and control of defects in semiconductors
  name:
    name part: Tuomisto, Filip
    role:
      role term: editor.
  type of resource: text
  genre: bibliography
  genre: elektronické knihy
  genre: electronic books
  origin info:
    place:
      place term: enk
    date issued: 2019
    copyright date: 2019
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (596 pages)
  abstract: The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation spectroscopy; first principles methods; microscopy; 3D atomic-scale studies; ion beam modification; and ion beam analysis and channelling.
  target audience: specialized
  note: edited by Filip Tuomisto.
  note: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
  note: Includes bibliographical references and index.
  subject:
    topic: Ion implantation
  subject:
    topic: Magnetic resonance
  subject:
    topic: Semiconductor doping
  subject:
    topic: Semiconductors
    topic: Materials
  subject:
    topic: Silicon
  related item:
    title info:
      title: Characterisation and control of defects in semiconductors
    origin info:
      publisher: Stevenage : The Institution of Engineering and Technology, 2019
    identifier: (OCoLC)1091584905
  related item:
    title info:
      title: Materials, circuits and devices series ; 45
  identifier: 1785616560
  identifier: 9781785616563
  identifier: 9781785616556
  identifier: 1785616552
  identifier: https://proxy.k.utb.cz/login
  access condition: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
  record info:
    record content source: STF
    record creation date: 191204
    record change date: 20240717213016.0
    record identifier: kn-on1132297460
    language of cataloging:
      language term: eng