Characterisation and control of defects in semiconductors
The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation s...
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| Other Authors | |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Stevenage :
The Institution of Engineering and Technology,
2019.
|
| Series | Materials, circuits and devices series ;
45. |
| Subjects | |
| Online Access | Full text |
| ISBN | 1785616560 9781785616563 9781785616556 1785616552 |
| Physical Description | 1 online resource (596 pages) |
Cover
| Summary: | The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation spectroscopy; first principles methods; microscopy; 3D atomic-scale studies; ion beam modification; and ion beam analysis and channelling. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 1785616560 9781785616563 9781785616556 1785616552 |
| Access: | Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty |
| Physical Description: | 1 online resource (596 pages) |