Springer handbook of microscopy

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel micros...

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Bibliographic Details
Other Authors Hawkes, P. W. (Editor), Spence, John C. H. (Editor)
Format Electronic eBook
LanguageEnglish
Published Cham, Switzerland : Springer, 2019.
SeriesSpringer Handbooks,
Subjects
Online AccessFull text
ISBN9783030000691
3030000699
9783030000684
3030000680
ISSN2522-8692
Physical Description1 online resource (xxxii, 1543 pages) : color illustrations

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Table of Contents:
  • Part A: Electron and Ion Microscopy
  • Kirkland et al.: Atomic Resolution Transmission Electron Microscopy
  • Nellist: Scanning Transmission Electron Microscopy
  • Ross & Minor: In situ Transmission Electron Microscopy
  • Plitzko & Baumeister: Crytoelectron TEM
  • Erdmann et al: Scanning Electron Microscopy
  • Thiel: Variable Pressure Scanning Electron Microscopy
  • Botton, Pradhudev: Analytical Electron Microscopy
  • Campbell et al: High-Speed Electron Microscopy
  • Bauer: LEEM, SPLEEM and SPELEEM
  • Feng & Scholl: Photoemission Electron Microscopy
  • Tromp: Spectroscopy with the Low Energy Electron Microscope
  • Van Aert: Model-Based Electron Microscopy
  • Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer
  • Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography
  • Part B: Holography, Ptychography and Diffraction
  • Dunin-Borkowski et al.: Electron Holography.-Rodenburg & Maiden: Ptychography
  • Zuo: Electron Nanodiffraction
  • Musumeci & Li: High-Energy Time-Resolved Electron Diffraction
  • Spence: Diffractive Imaging of Single Particles
  • Part C: Photon-based Microscopy
  • Diaspro et al: Fluorescence Microscopy
  • Sahl et al.: Far-Field Fluorescence Microscopy
  • Jacobson et al: Zone-Plate X-Ray Microscopy
  • Lin et al: Microcomputed Tomography
  • Part D: Applied Microscopy
  • Huey et al: Scanning Probe Microscopy in Materials Science
  • Leary & Midgeley: Electron Tomography in Materials Science
  • Sutter: Scanning Tunneling Microscopy in Surface Science
  • Hamidian et al: Visualizing electronic quantum matter
  • Ma et al (Terasaki): Microscopy of Nanoporous Crystals
  • Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography
  • Amrein & Stamov: Atomic Force Microscopy in the Life Sciences
  • Jones: Microscopy in Forensic Sciences.