Component reliability for electronic systems

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Bibliographic Details
Main Author Băjenescu, Titu I., 1938- (Author)
Other Authors Bâzu, M. I. 1948-
Format Electronic eBook
LanguageEnglish
Published Boston, Mass. ; London : Artech House, 2010.
Subjects
Online AccessFull text
ISBN9781523119271
1523119276
9781596934368
Physical Description1 online resource (xix, 685 pages) : illustrations

Cover

Table of Contents:
  • Introduction
  • Reliability building
  • Reliability assessment
  • Package and reliability
  • Failure analysis
  • Test and testability
  • Reliability of passive electronic parts
  • Reliability of diodes
  • Silicon power transistor reliability
  • Reliability of optoelectronic components
  • Reliability of thyristors and triacs
  • Reliability of monolithic ICs
  • Reliability of memories and microprocessors
  • Reliability of hybrid ICs
  • Reliability of micro- and nanosystems.