Component reliability for electronic systems

"The main reason for the premature breakdown of today s electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. To help ensure longer-lasting, more technically sound products and systems, a solid understanding of effective wa...

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Bibliographic Details
Main Author: Băjenescu, Titu I., 1938- (Author)
Other Authors: Bâzu, M. I. 1948-
Format: eBook
Language: English
Published: Boston, Mass. ; London : Artech House, 2010.
Subjects:
Electronic systems > Testing.
Reliability (Engineering)
Component software > Reliability.
Software architecture > Reliability.
elektronické knihy
electronic books
ISBN: 9781523119271
1523119276
9781596934368
Physical Description: 1 online resource (xix, 685 pages) : illustrations

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Table of contents

LEADER 03494cam a2200421 i 4500
001 kn-on1057382066
003 OCoLC
005 20240717213016.0
006 m o d
007 cr cn|||||||||
008 181019s2010 maua ob 001 0 eng d
040 |a HUA  |b eng  |e rda  |e pn  |c HUA  |d OCLCF  |d UWW  |d UAB  |d KNOVL  |d CEF  |d MERER  |d OCLCQ  |d VLB  |d UKAHL  |d OCLCO  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCO  |d OCLCL  |d INARC  |d OCLCO  |d OCLCQ  |d OCLCO  |d SXB 
020 |a 9781523119271  |q (electronic bk.) 
020 |a 1523119276  |q (electronic bk.) 
020 |z 9781596934368 
035 |a (OCoLC)1057382066 
100 1 |a Băjenescu, Titu I.,  |d 1938-  |e author.  |1 https://id.oclc.org/worldcat/entity/E39PCjtdFdqtk4jWxgkWfBGgVd 
245 1 0 |a Component reliability for electronic systems /  |c Titu-Marius I. Bajenescu, Marius I. Bazu. 
264 1 |a Boston, Mass. ;  |a London :  |b Artech House,  |c 2010. 
264 4 |c ©2009 
300 |a 1 online resource (xix, 685 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
505 0 |a Introduction -- Reliability building -- Reliability assessment -- Package and reliability -- Failure analysis -- Test and testability -- Reliability of passive electronic parts -- Reliability of diodes -- Silicon power transistor reliability -- Reliability of optoelectronic components -- Reliability of thyristors and triacs -- Reliability of monolithic ICs -- Reliability of memories and microprocessors -- Reliability of hybrid ICs -- Reliability of micro- and nanosystems. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 1 |a "The main reason for the premature breakdown of today s electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. To help ensure longer-lasting, more technically sound products and systems, a solid understanding of effective ways to minimize the degradation is essential." "This practical book offers you specific guidance on how to design more reliable components and build more reliable electronic systems. You learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for your applications. Moreover, the book helps you ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure."--Jacket 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Electronic systems  |x Testing. 
650 0 |a Reliability (Engineering) 
650 0 |a Component software  |x Reliability. 
650 0 |a Software architecture  |x Reliability. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Bâzu, M. I.  |q (Marius I.),  |d 1948-  |1 https://id.oclc.org/worldcat/entity/E39PCjDgrRM3BpPPfCTF9tqFw3 
776 0 8 |i Print version:  |a Băjenescu, Titu I., 1938-  |t Component reliability for electronic systems.  |d Boston, Mass. ; London : Artech House, 2010  |z 9781596934368  |w (OCoLC)477251747 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpCRES0001/component-reliability-for?kpromoter=marc  |y Full text 

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