ISTFA 2017 : conference proceedings from the 43rd International Symposium for Testing and Failure Analysis : November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA

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Bibliographic Details
Corporate Authors International Symposium for Testing and Failure Analysis Fort Worth, Tex., ASM International, Electronic Device Failure Analysis Society
Format Electronic eBook
LanguageEnglish
Published Materials Park, Ohio : ASM International, ©2017.
Subjects
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
elektronické knihy
electronic books
Online AccessFull text
ISBN9781627081511
1627081518
162708150X
9781627081504
Physical Description1 online resource (665 pages)

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Bibliography:Includes bibliographical references and index.
ISBN:9781627081511
1627081518
162708150X
9781627081504
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
Physical Description:1 online resource (665 pages)

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