ISTFA 2016 : conference proceedings from the 42nd International Symposium for Testing and Failure Analysis ; November 6-10, 2016, Fort Worth Convention Center, Fort Worth, Texas, USA

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Bibliographic Details
Corporate Author: International Symposium for Testing and Failure Analysis Houston, Tex.)
Format: eBook
Language: English
Published: Materials Park, Ohio : ASM International, 2016.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
elektronické knihy
electronic books
ISBN: 9781627081351
1627081356
9781627081368
1627081364
Physical Description: 1 online resource (xviii, 641 pages :) : illustrations, photographs

Cover

Table of contents

LEADER 01934cam a2200397 i 4500
001 kn-on1001514766
003 OCoLC
005 20240717213016.0
006 m o d
007 cr cn|||||||||
008 170413t20162016ohuao o 101 0 eng
040 |a AU@  |b eng  |c AU@  |d OCLCO  |d OCLCF  |d OCLCQ  |d OCLCO  |d OCLCQ 
020 |a 9781627081351  |q (pbk.) 
020 |a 1627081356  |q (pbk.) 
020 |a 9781627081368  |q (e-book) 
020 |a 1627081364  |q (e-book) 
035 |a (OCoLC)1001514766 
111 2 |a International Symposium for Testing and Failure Analysis  |n (42nd :  |d 2016 :  |c Houston, Tex.) 
245 1 0 |a ISTFA 2016 :  |b conference proceedings from the 42nd International Symposium for Testing and Failure Analysis ; November 6-10, 2016, Fort Worth Convention Center, Fort Worth, Texas, USA /  |c organized by Electronic Device Failure Analysis Society, ISTFA/16, ASM International. 
264 1 |a Materials Park, Ohio :  |b ASM International,  |c 2016. 
264 4 |c ©2016 
300 |a 1 online resource (xviii, 641 pages :) :  |b illustrations, photographs 
336 |a text  |b txt  |2 rdacontent 
336 |a still image  |b sti  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
500 |a Includes author index. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
710 2 |a Electronic Device Failure Analysis Society,  |e organizer. 
710 2 |a ASM International,  |e organizer. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpISTFAC56/istfa-2016-conference?kpromoter=marc  |y Full text 

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