ISTFA 2015 : conference proceedings from the 41st International Symposium for Testing and Failure Analysis, November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA
Annotation
Saved in:
| Corporate Author | |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Materials Park, Ohio :
ASM International,
[2015]
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9781627081030 1627081038 9781523102068 1523102063 162708102X 9781627081023 |
| Physical Description | 1 online resource |
Cover
| LEADER | 00000cam a2200000Mi 4500 | ||
|---|---|---|---|
| 001 | kn-ocn944175695 | ||
| 003 | OCoLC | ||
| 005 | 20240717213016.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 160304s2015 ohu o 100 0 eng d | ||
| 040 | |a CN3GA |b eng |e rda |e pn |c CN3GA |d OCLCO |d OCLCF |d OCLCO |d KNOVL |d OCLCO |d COO |d OCLCA |d OCLCQ |d YDXCP |d EBLCP |d REB |d COCUF |d MOR |d CCO |d PIFAG |d ZCU |d VT2 |d MERUC |d OCLCQ |d U3W |d WRM |d STF |d EZ9 |d RRP |d ICG |d OCLCQ |d TKN |d DKC |d AU@ |d OCLCQ |d UAB |d OCLCQ |d OCLCO |d HNC |d OCLCQ |d OCLCO | ||
| 020 | |a 9781627081030 |q (electronic bk.) | ||
| 020 | |a 1627081038 |q (electronic bk.) | ||
| 020 | |a 9781523102068 |q (electronic bk.) | ||
| 020 | |a 1523102063 |q (electronic bk.) | ||
| 020 | |z 162708102X | ||
| 020 | |z 9781627081023 | ||
| 035 | |a (OCoLC)944175695 |z (OCoLC)940934393 |z (OCoLC)950980466 | ||
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (41st : |d 2015 : |c Portland, Or.), |j issuing body. | |
| 245 | 1 | 0 | |a ISTFA 2015 : |b conference proceedings from the 41st International Symposium for Testing and Failure Analysis, November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA / |c organized by the Electronic Device Failure Analysis Society. |
| 264 | 1 | |a Materials Park, Ohio : |b ASM International, |c [2015] | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
| 520 | 8 | |a Annotation |b This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, 'Follow the Data'. | |
| 590 | |a Knovel |b Knovel (All titles) | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 776 | 0 | 8 | |i Print version: |a Asm International. |t Istfa 2015 proceedings from the 41st international symposium for testing and failure analysis. |d [Place of publication not identified] : A S M International, 2015 |z 162708102X |z 9781627081023 |w (OCoLC)930486191 |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpISTFAC4I/istfa-2015-conference?kpromoter=marc |y Full text |