ISTFA 2015 : conference proceedings from the 41st International Symposium for Testing and Failure Analysis, November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA

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Bibliographic Details
Corporate Author: International Symposium for Testing and Failure Analysis Portland, Or.),
Format: eBook
Language: English
Published: Materials Park, Ohio : ASM International, [2015]
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
elektronické knihy
electronic books
ISBN: 9781627081030
1627081038
9781523102068
1523102063
162708102X
9781627081023
Physical Description: 1 online resource

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Table of contents

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007 cr cn|||||||||
008 160304s2015 ohu o 100 0 eng d
040 |a CN3GA  |b eng  |e rda  |e pn  |c CN3GA  |d OCLCO  |d OCLCF  |d OCLCO  |d KNOVL  |d OCLCO  |d COO  |d OCLCA  |d OCLCQ  |d YDXCP  |d EBLCP  |d REB  |d COCUF  |d MOR  |d CCO  |d PIFAG  |d ZCU  |d VT2  |d MERUC  |d OCLCQ  |d U3W  |d WRM  |d STF  |d EZ9  |d RRP  |d ICG  |d OCLCQ  |d TKN  |d DKC  |d AU@  |d OCLCQ  |d UAB  |d OCLCQ  |d OCLCO  |d HNC  |d OCLCQ  |d OCLCO 
020 |a 9781627081030  |q (electronic bk.) 
020 |a 1627081038  |q (electronic bk.) 
020 |a 9781523102068  |q (electronic bk.) 
020 |a 1523102063  |q (electronic bk.) 
020 |z 162708102X 
020 |z 9781627081023 
035 |a (OCoLC)944175695  |z (OCoLC)940934393  |z (OCoLC)950980466 
111 2 |a International Symposium for Testing and Failure Analysis  |n (41st :  |d 2015 :  |c Portland, Or.),  |j issuing body. 
245 1 0 |a ISTFA 2015 :  |b conference proceedings from the 41st International Symposium for Testing and Failure Analysis, November 1-5, 2015, Oregon Convention Center, Portland, Oregon, USA /  |c organized by the Electronic Device Failure Analysis Society. 
264 1 |a Materials Park, Ohio :  |b ASM International,  |c [2015] 
300 |a 1 online resource 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 8 |a Annotation  |b This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, 'Follow the Data'. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
776 0 8 |i Print version:  |a Asm International.  |t Istfa 2015 proceedings from the 41st international symposium for testing and failure analysis.  |d [Place of publication not identified] : A S M International, 2015  |z 162708102X  |z 9781627081023  |w (OCoLC)930486191 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpISTFAC4I/istfa-2015-conference?kpromoter=marc  |y Full text 

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