Advances in imaging and electron physics. Volume one hundred and ninety three /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Bibliographic Details
Other Authors Hawkes, P. W. (Editor)
Format Electronic eBook
LanguageEnglish
Published Amsterdam [Netherlands] : Academic Press, 2016.
EditionFirst edition.
SeriesAdvances in imaging and electron physics.
Subjects
Electrons.
Image processing.
Electronics.
elektronické knihy
electronic books
Online AccessFull text
ISBN9780128052310
0128052317
9780128048153
0128048158
9780128052303
0128052309
ISSN1076-5670 ;
Physical Description1 online resource (xiii, 140 pages) : illustrations (some color).

Cover

Table of Contents:
  • 1. Utilizing the Eigen-Emittance Concept for Bright Electron Beams / Alex J. Dragt
  • 1. Introduction
  • 2. Theory
  • 3. Construction of Initial Distributions
  • 4. Applications to Bright Electron Beams
  • 5. Summary and Discussion
  • References
  • 2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers / Igor Spivak-Lavrov
  • 1. Introduction
  • 2. Analytical Equations for Calculating the Dynamics of the Charged Particle Beam and Their General Properties
  • 3. Analytical Methods of Calculating 2D Fields and Fields Reduced to the 2D Ones
  • 4. Numerical Calculation of Instrument Characteristics of Static and TOF Mass Spectrometers
  • 5. Summary and Conclusions.

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