Advances in imaging and electron physics. Volume one hundred and ninety three /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Bibliographic Details
Other Authors Hawkes, P. W. (Editor)
Format Electronic eBook
LanguageEnglish
Published Amsterdam [Netherlands] : Academic Press, 2016.
EditionFirst edition.
SeriesAdvances in imaging and electron physics.
Subjects
Online AccessFull text
ISBN9780128052310
0128052317
9780128048153
0128048158
9780128052303
0128052309
ISSN1076-5670 ;
Physical Description1 online resource (xiii, 140 pages) : illustrations (some color).

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245 0 0 |a Advances in imaging and electron physics.  |n Volume one hundred and ninety three /  |c edited by Peter W. Hawkes. 
246 3 0 |a Advances in imaging and electron physics.  |n Volume 193 
250 |a First edition. 
264 1 |a Amsterdam [Netherlands] :  |b Academic Press,  |c 2016. 
264 4 |c ©2016 
300 |a 1 online resource (xiii, 140 pages) :  |b illustrations (some color). 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Advances in Imaging and Electron Physics,  |x 1076-5670 ;  |v Volume 193 
504 |a Includes bibliographical references at the end of each chapters and index. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field. 
505 0 |a 1. Utilizing the Eigen-Emittance Concept for Bright Electron Beams / Alex J. Dragt -- 1. Introduction -- 2. Theory -- 3. Construction of Initial Distributions -- 4. Applications to Bright Electron Beams -- 5. Summary and Discussion -- References -- 2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers / Igor Spivak-Lavrov -- 1. Introduction -- 2. Analytical Equations for Calculating the Dynamics of the Charged Particle Beam and Their General Properties -- 3. Analytical Methods of Calculating 2D Fields and Fields Reduced to the 2D Ones -- 4. Numerical Calculation of Instrument Characteristics of Static and TOF Mass Spectrometers -- 5. Summary and Conclusions. 
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650 0 |a Electrons. 
650 0 |a Image processing. 
650 0 |a Electronics. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Hawkes, P. W.,  |e editor. 
776 0 8 |i Print version:  |t Advances in imaging and electron physics. Volume one hundred and ninety one.  |b First edition  |z 9780128048153 
830 0 |a Advances in imaging and electron physics. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpAIEPV001/advances-in-imaging?kpromoter=marc  |y Full text