Ionizing radiation effects in electronics : from memories to imagers
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important...
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| Other Authors | , |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Boca Raton, FL :
CRC Press,
[2016]
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| Series | Devices, circuits, and systems.
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| Subjects | |
| Online Access | Full text |
| ISBN | 9781498722636 1498722636 9781523107001 1523107006 9781498722605 1498722601 |
| Physical Description | 1 online resource (xviii, 391 pages) : illustrations |
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| LEADER | 00000cam a2200000 i 4500 | ||
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| 001 | kn-ocn929951542 | ||
| 003 | OCoLC | ||
| 005 | 20240717213016.0 | ||
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| 008 | 151119s2016 flua ob 001 0 eng d | ||
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| 020 | |a 1498722636 |q (electronic bk.) | ||
| 020 | |a 9781523107001 |q (electronic bk.) | ||
| 020 | |a 1523107006 |q (electronic bk.) | ||
| 020 | |z 9781498722605 | ||
| 020 | |z 1498722601 | ||
| 035 | |a (OCoLC)929951542 |z (OCoLC)930017685 |z (OCoLC)932332284 |z (OCoLC)937390339 |z (OCoLC)1008947105 |z (OCoLC)1066524405 |z (OCoLC)1103250382 |z (OCoLC)1129361631 |z (OCoLC)1153011553 | ||
| 245 | 0 | 0 | |a Ionizing radiation effects in electronics : |b from memories to imagers / |c edited by Marta Bagatin, Simone Gerardin. |
| 264 | 1 | |a Boca Raton, FL : |b CRC Press, |c [2016] | |
| 264 | 4 | |c ©2016 | |
| 300 | |a 1 online resource (xviii, 391 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Devices, circuits, and systems | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Front Cover; Contents; Preface; Editors; Contributors; Chapter 1: Introduction to the Effects of Radiation on Electronic Devices; Chapter 2: Monte Carlo Simulation of Radiation Effects; Chapter 3: A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies; Chapter 4: Radiation Effects in DRAMs; Chapter 5: Radiation Effects in Flash Memories; Chapter 6: Microprocessor Radiation Effects; Chapter 7: Soft-Error Hardened Latch and Flip-Flop Design; Chapter 8: Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs. | |
| 505 | 8 | |a Chapter 9: Single-Event Mitigation Techniques for Analog and Mixed-Signal CircuitsChapter 10: CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics : TID Effects and Bulk Damage Study; Chapter 11: Radiation Effects on CMOS Active Pixel Image Sensors; Chapter 12: Natural Radiation Effects in CCD Devices; Chapter 13: Radiation Effects on Optical Fibers and Fiber-Based Sensors; Back Cover. | |
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
| 520 | |a Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories--static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time. | ||
| 590 | |a Knovel |b Knovel (All titles) | ||
| 650 | 0 | |a Ionizing radiation. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 700 | 1 | |a Bagatin, Marta, |e editor. | |
| 700 | 1 | |a Gerardin, Simone, |e editor. | |
| 776 | 0 | 8 | |i Print version: |a Bagatin, Marta. |t Ionizing Radiation Effects in Electronics : From Memories to Imagers. |d : CRC Press, ©2015 |
| 830 | 0 | |a Devices, circuits, and systems. | |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpIREEFMI1/ionizing-radiation-effects?kpromoter=marc |y Full text |