Metrology and theory of measurement

"Metrology is the science of measurements. It is traceable to measurement standards, thus to the concept of measurement accuracy, which is used in all natural and technical sciences, as well as in some fields of social sciences and liberal arts. The key problem is one of obtaining knowledge of...

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Bibliographic Details
Main Authors: Slaev, Valery A., (Author), Chunovkina, Anna G., (Author), Mironovskiĭ, L. A. (Author)
Format: eBook
Language: English
Published: Berlin ; Boston : De Gruyter, [2013]
Series: De Gruyter studies in mathematical physics ; 20.
Subjects:
ISBN: 9783110284829
3110284820
9781680152128
1680152122
9783110284737
3110284731
Physical Description: 1 online resource (xxi, 560 pages) : illustrations

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LEADER 05527cam a2200469 i 4500
001 kn-ocn897919799
003 OCoLC
005 20240717213016.0
006 m o d
007 cr cn|||||||||
008 141210t20132013gw a ob 001 0 eng d
040 |a KNOVL  |b eng  |e rda  |e pn  |c KNOVL  |d YDXCP  |d OCLCF  |d EBLCP  |d CN3GA  |d N$T  |d E7B  |d COO  |d DEBBG  |d DEBSZ  |d WAU  |d AGLDB  |d MOR  |d PIFAG  |d ZCU  |d MERUC  |d OCLCQ  |d JBG  |d DEGRU  |d U3W  |d STF  |d OCLCQ  |d VTS  |d CEF  |d OCLCQ  |d INT  |d OCLCQ  |d WYU  |d TKN  |d OCLCQ  |d LEAUB  |d DKC  |d OCLCQ  |d M8D  |d UKAHL  |d OCLCQ  |d AJS  |d OCLCO  |d OCLCQ  |d UPM  |d OCLCQ  |d OCLCO  |d OCLCL  |d SXB  |d OCLCQ 
020 |a 9783110284829  |q (electronic book) 
020 |a 3110284820  |q (electronic book) 
020 |a 9781680152128  |q (electronic book) 
020 |a 1680152122  |q (electronic book) 
020 |z 9783110284737  |q (hardback) 
020 |z 3110284731  |q (hardback) 
035 |a (OCoLC)897919799  |z (OCoLC)858761652  |z (OCoLC)880456861  |z (OCoLC)992836217 
100 1 |a Slaev, Valery A.,  |e author. 
245 1 0 |a Metrology and theory of measurement /  |c Valery A. Slaev, Anna G. Chunovkina, Leonid A. Mironovsky. 
264 1 |a Berlin ;  |a Boston :  |b De Gruyter,  |c [2013] 
264 4 |c ©2013 
300 |a 1 online resource (xxi, 560 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a De Gruyter studies in mathematical physics ;  |v 20 
504 |a Includes bibliographical references (pages 512-544) and index. 
505 0 |a International measurement system. Principles underlying the international measurement system ; Classification of key comparisons of national measurement standards ; Basic approaches to evaluating key comparison data ; Expression of the degree of equivalence of measurement standards on the basis of a mixture of distributions ; Evaluation of regional key comparison data ; Bayesian approach to the evaluation of systematic biases of measurement results in laboratories ; Evaluation of measurement results in calibrating material measures and measuring instruments ; Summary. -- Systems of reproducing physical quantities units and transferring their sizes. Classification of reproducing physical quantities units and systems for transferring their sizes (RUTS) ; Physical-metrological fundamentals of constructing the RUTS systems ; Summary. -- Potential measurement accuracy. System approach to describing a measurement ; Potential and limit accuracies of measurements ; Accuracy limitations due to the components of a measurement task ; Influence of external measurement conditions ; Space-time limitations ; Summary. -- Algorithms for evaluating the result of two or three measurements. General ideas ; Evaluation problem and classical means ; Algorithms of optimal evaluation ; Heuristic methods for obtaining estimates ; Structural and diagnostic methods for obtaining estimates ; Application of means for filtering problems ; Summary. -- Metrological traceability of measurement results (illustrated by an example of magnetic recording instruments). General ideas ; Precise magnetic recording instruments (MRI) of analog electrical signals as a part of measuring systems; MRI metrological traceability ; Methods of determining MRI metrological characteristics ; Hardware implementation of the methods for determining MRI metrological characteristics ; Summary. -- Validation of software used in metrology. General ideas ; Tasks of the metrological validation of software (MVS) used in metrology ; Approaches to evaluating precision parameters of software used in metrology ; Requirements for software and methods for its validation ; Type approval ; Assessment of severity (risk) levels ; Summary. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a "Metrology is the science of measurements. It is traceable to measurement standards, thus to the concept of measurement accuracy, which is used in all natural and technical sciences, as well as in some fields of social sciences and liberal arts. The key problem is one of obtaining knowledge of the physical reality, which is observed through a prism of an assemblage of quantity properties describing the objectively-real world. One of the fundamental tasks of metrology is the development of theoretical and methodological aspects of the procedure of getting an accurate knowledge relating to objects and processes of the surrounding world. Due to the rapid development of information technologies and intelligent measurement systems and measuring instruments, as well as to the growing usage of mathematical methods in social and biological sciences, this monograph is dedicated to convey the fundamental theory."--Publisher's website 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Metrology. 
650 0 |a Measurement  |x Standards. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Chunovkina, Anna G.,  |e author. 
700 1 |a Mironovskiĭ, L. A.  |q (Leonid Alekseevich),  |e author.  |1 https://id.oclc.org/worldcat/entity/E39PCjMg6dV74qXPp3dvXT8WcP 
776 0 8 |i Print version:  |a Slaev, Valery A.  |t Metrology and theory of measurement  |z 9783110284737  |w (DLC) 2012050092  |w (OCoLC)822971531 
830 0 |a De Gruyter studies in mathematical physics ;  |v 20. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpMTM00001/metrology-and-theory?kpromoter=marc  |y Full text