Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy

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Bibliographic Details
Main Author: Oku, Takeo, 1965- (Author)
Format: eBook
Language: English
Published: Berlin ; Boston : De Gruyter, [2014]
Subjects:
ISBN: 3110305011
9783110305012
9781523100545
1523100540
9783110388046
3110388049
3110304724
9783110304725
Physical Description: 1 online resource (viii, 168 pages .)

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024 7 |a 10.1515/9783110305012  |2 doi 
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100 1 |a Oku, Takeo,  |d 1965-  |e author.  |1 https://id.oclc.org/worldcat/entity/E39PCjG9mwMgPwXr4qcKvfd9cP 
245 1 0 |a Structure analysis of advanced nanomaterials :  |b nanoworld by high-resolution electron microscopy /  |c Takeo Oku. 
264 1 |a Berlin ;  |a Boston :  |b De Gruyter,  |c [2014] 
300 |a 1 online resource (viii, 168 pages .) 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
505 0 |a Preface; Contents; Table for physical constants; 1 Introduction; 1.1 Characteristic of electron microscopy; 1.2 What information can be obtained by electron microscopy?; 1.3 Various types of electron microscopy; 2 Structure and principle of electron microscopes; 2.1 Structure of transmission electron microscope; 2.2 Observation mechanism of atoms by electrons; 2.3 Information from electron diffraction pattern; 2.4 High-resolution electron microscopy; 2.5 Scanning electron microscope; 2.6 Electron energy-loss spectroscopy; 2.7 Energy dispersive X-ray spectroscopy. 
505 8 |a 2.8 High-angle annular dark-field scanning TEM2.9 Electron holography and Lorentz microscopy; 2.10 Image simulation; 3 Practice of HREM; 3.1 Sample preparation; 3.2 Specimen preparation methods; 3.3 Structure analysis by X-ray diffraction; 3.4 TEM observation; 3.5 HREM observation; 3.6 Fourier filtering; 3.7 Resolution of HREM images; 3.8 Prevention of damage and contamination; 3.9 Taking images and reading data; 3.10 Mental attitude for TEM; 4 Characterization by HREM; 4.1 What information can be obtained?; 4.2 Direct atomic observation; 4.3 Crystallographic image processing. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a <!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator></head> <body> High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. </body></html> 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Transmission electron microscopy. 
650 0 |a High resolution electron microscopy. 
650 0 |a Nanostructured materials. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
776 0 8 |i Print version:  |z 3110304724  |z 9783110304725 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpSAANNHR2/structure-analysis-of?kpromoter=marc  |y Full text