Modern X-ray analysis on single crystals : a practical guide
This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography...
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| Main Author: | |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; Boston :
Walter de Gruyter GmbH & Co. KG,
2013.
|
| Edition: | 2nd edition. |
| Subjects: | |
| ISBN: | 9783110308280 3110308282 9781523100576 1523100575 9783110370614 3110370611 9783110308235 3110308231 |
| Physical Description: | 1 online resource |
Cover
Table of contents
| LEADER | 05499cam a2200493 i 4500 | ||
|---|---|---|---|
| 001 | kn-ocn876592818 | ||
| 003 | OCoLC | ||
| 005 | 20240717213016.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 140414s2013 gw o 001 0 eng d | ||
| 040 | |a N$T |b eng |e rda |e pn |c N$T |d CDX |d OCLCF |d DEBBG |d EBLCP |d HEBIS |d YDXCP |d DEBSZ |d KNOVL |d N$T |d ZCU |d AGLDB |d OCLCQ |d MERUC |d OCLCQ |d VTS |d CEF |d RRP |d ICG |d OCLCQ |d STF |d DKC |d AU@ |d OCLCQ |d M8D |d OCLCQ |d S9I |d OCLCQ |d AJS |d OCLCQ |d OCLCO |d OCLCQ |d OCLCO |d OCLCL |d SXB | ||
| 020 | |a 9783110308280 |q (electronic bk.) | ||
| 020 | |a 3110308282 |q (electronic bk.) | ||
| 020 | |a 9781523100576 |q (electronic bk.) | ||
| 020 | |a 1523100575 |q (electronic bk.) | ||
| 020 | |a 9783110370614 |q (electronic bk.) | ||
| 020 | |a 3110370611 |q (electronic bk.) | ||
| 020 | |z 9783110308235 | ||
| 020 | |z 3110308231 | ||
| 020 | |z 3110370611 | ||
| 035 | |a (OCoLC)876592818 |z (OCoLC)875819003 |z (OCoLC)900213162 |z (OCoLC)900283017 |z (OCoLC)958545452 | ||
| 100 | 1 | |a Luger, Peter, |d 1943- |e author. |1 https://id.oclc.org/worldcat/entity/E39PBJhMfwJPcpgw688McjQg8C | |
| 245 | 1 | 0 | |a Modern X-ray analysis on single crystals : |b a practical guide / |c by Peter Luger. |
| 250 | |a 2nd edition. | ||
| 264 | 1 | |a Berlin ; |a Boston : |b Walter de Gruyter GmbH & Co. KG, |c 2013. | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a Includes index. | ||
| 505 | 0 | |a 1 Introduction; 1.1 Historical remarks; 1.2 The crystal lattice: Basic definitions; 1.2.1 Periodicity, lattice constants; 1.2.2 Lattice points, lattice planes, reciprocal lattice; 1.3 Sample structures; 2 Fundamental results of diffraction theory, X-radiation; 2.1 Electron density and related functions; 2.2 Diffraction conditions for single crystals; 2.3 X-rays; 2.3.1 Generation of X-rays; 2.3.2 Absorption; 2.3.3 Filters, monochromators; 2.3.4 X-ray tubes; 2.3.5 Synchrotron radiation; 3 Preliminary experiments; 3.1 Film methods; 3.1.1 The rotation method; 3.1.2 Zero level Weissenberg method. | |
| 505 | 8 | |a 3.1.3 Upper level Weissenberg -- normal beam and equi-inclination method3.1.4 Precession technique; 3.2 Practicing film techniques; 3.2.1 Choice of experimental conditions; 3.2.2 Rotation and Weissenberg photographs of KAMTRA and SUCROS; 4 Crystal symmetry; 4.1 Symmetry operations in a crystal lattice; 4.1.1 Introduction; 4.1.2 Basic symmetry operations; 4.1.3 Crystal classes and related coordinate systems; 4.1.4 Translational symmetry, lattice types and space groups; 4.2 Crystal symmetry and related intensity symmetry; 4.2.1 Representation of? and F as Fourier series. | |
| 505 | 8 | |a 4.2.2 Thermal motion, displacement parameters4.2.3 Intensity symmetry, asymmetric unit; 4.2.4 Systematic extinctions; 4.2.5 Quasicrystals; 4.3 Space group determination; 4.3.1 General considerations, practical aspects; 4.3.2 Space groups of KAMTRA and SUCROS from film exposures; 5 Diffractometer measurements; 5.1 Point detector data collection on a four-circle diffractometer; 5.1.1 Eulerian cradle geometry; 5.1.2 Choice of experimental conditions; 5.1.3 Precise determination of lattice constants; 5.1.4 Intensity measurements; 5.2 Area detector diffractometers; 5.2.1 Imaging plates. | |
| 505 | 8 | |a 5.2.2 CCD diffractometers5.2.3 Data processing for area detector measurements; 5.2.4 Data collections for B12 and C60F18; 6 Computer programs; 7 Solution of the phase problem; 7.1 Data reduction; 7.2 Fourier methods; 7.2.1 Interpretation of the Patterson function; 7.2.2 Heavy atom methods, principle of difference electron density; 7.2.3 Harker sections, applications to KAMTRA; 7.2.4 Numerical calculation of Fourier syntheses; 7.3 Direct methods; 7.3.1 Normalization; 7.3.2 Fundamental formulae; 7.3.3 Origin definition, choice of starting set. | |
| 505 | 8 | |a 7.3.4 Application of direct methods, the examples of SUCROS and C60F187.4 Phase determination for macromolecules; 8 Refinements; 8.1 Theoretical aspects; 8.1.1 Model versus experiment, R-value; 8.1.2 Theory of least-squares refinement; 8.2 Practicing least-squares methods; 8.2.1 Aspects of numerical calculations; 8.2.2 Execution of a complete refinement process; 8.2.3 Corrections to be applied during refinement; 8.3 Analysis and representation of results; 8.3.1 Geometrical data; 8.3.2 Graphical representations; 8.3.3 Archiving data, crystallographic information file (CIF). | |
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
| 520 | |a This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level. | ||
| 590 | |a Knovel |b Knovel (All titles) | ||
| 650 | 0 | |a X-ray crystallography. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 776 | 0 | 8 | |i Print version: |a Luger, Peter, 1943- |t Modern X-ray analysis on single crystals. |b 2nd edition |z 9783110308235 |w (DLC) 2013045276 |w (OCoLC)862962293 |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpMXRASCA9/modern-x-ray?kpromoter=marc |y Full text |
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