Modern RF and microwave measurement techniques
"This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and...
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| Other Authors | |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
New York :
Cambridge University Press,
2013.
|
| Series | Cambridge RF and microwave engineering series.
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9781107250482 110725048X 9781139567626 1139567624 9781628705126 1628705124 9781107247994 1107247993 9781107248823 1107248825 9781299772663 1299772668 9781107036413 1107036410 |
| Physical Description | 1 online resource (xxv, 447 pages) |
Cover
Table of Contents:
- Cover.pdf; Cover; Modern RF and Microwave Measurement Techniques; Title; Copyright page; Contents; Preface; Contributors; Abbreviations; Part I General concepts; 1 Transmission lines and scattering parameters; 1.1 Introduction; 1.2 Fundamentals of transmission lines, models and equations; 1.2.1 Introduction; 1.2.2 Propagation and characteristic impedance; 1.2.3 Terminations, reflection coefficient, SWR, return loss; 1.2.4 Power transfer to load; 1.3 Scattering parameters; 1.4 Microwave directional coupler; 1.4.1 General concepts; 1.4.2 The reflectometer; 1.5 Smith Chart; 1.6 Conclusions.
- 2 Microwave interconnections, probing, and fixturing2.1 Introduction; 2.2 Device boundaries and measurement reference planes; 2.2.1 Devices; 2.2.2 Transmission lines; 2.2.3 Circuits; 2.3 Signal-path fixture performance measures; 2.3.1 Delay; 2.3.2 Loss; 2.3.3 Mismatch; 2.3.4 Crosstalk; 2.3.5 Multiple-modes; 2.3.6 Electromagnetic discontinuity; 2.4 Power-ground fixture performance measures; 2.4.1 Non-ideal power; 2.4.2 Non-ideal ground; 2.5 Fixture loss performance and measurement accuracy; 2.6 Microwave probing; 2.6.1 Probing system elements; 2.6.2 VNA calibration of a probing system.
- 2.6.3 Probing applications
- in situ test2.6.4 Probing applications
- transistor characterization; 2.7 Conclusion; Part II Microwave instrumentation; 3 Microwave synthesizers; 3.1 Introduction; 3.2 Synthesizer characteristics; 3.2.1 Frequency and timing; 3.2.2 Spectral purity; 3.2.3 Output power; 3.3 Synthesizer architectures; 3.3.1 Direct analog synthesizers; 3.3.2 Direct digital synthesizers; 3.3.3 Indirect synthesizers; 3.3.4 Hybrid architectures; 3.4 Signal generators; 3.4.1 Power calibration and control; 3.4.2 Frequency and power sweep; 3.4.3 Modulation; 3.5 Conclusions.
- 4 Real-time spectrum analysis and time-correlated measurements4.1 Introduction; 4.1.1 Types of spectrum analyzers; 4.2 Spectrum analysis in real-time ; 4.2.1 Real-time criteria; 4.2.2 Theoretical background ; 4.3 Spectrum analysis using discrete Fourier transforms ; 4.3.1 The Fourier transform for discrete-time signals; 4.3.2 Regularly spaced sequential DFTs; 4.4 Windowing and resolution bandwidth (RBW); 4.4.1 Windowing considerations; 4.4.2 Resolution bandwidth (RBW); 4.5 Real-time specifications; 4.5.1 Real-time criteria.
- 4.5.2 Minimum event duration for 100% probability of intercept at thespecified accuracy4.5.3 Comparison with swept analyzers ; 4.5.4 Processing all information within a signal with no loss of information; 4.5.5 Windowing and overlap ; 4.5.6 Sequential DFTs as a parallel bank of filters; 4.5.7 Relating frame rate, frame overlap, and RBW; 4.5.8 Criteria for processing all signals in the input waveform with no loss of information; 4.6 Applications of real-time spectrum analysis; 4.6.1 Displaying real-time spectrum analysis data; 4.6.2 Digital persistence displays.