An introduction to mixed-signal IC test and measurement

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...

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Bibliographic Details
Main Author Roberts, Gordon W., 1959-
Other Authors Taenzler, Friedrich, Burns, Mark, 1962-
Format Electronic eBook
LanguageEnglish
Published New York : Oxford University Press, ©2012.
Edition2nd ed.
SeriesOxford series in electrical and computer engineering.
Subjects
Integrated circuits > Testing.
Mixed signal circuits > Testing.
elektronické knihy
electronic books
Online AccessFull text
ISBN9781613449486
1613449488
9780199796212
0199796211
Physical Description1 online resource (xxv, 836 pages) : illustrations

Cover

Table of Contents:
  • Overview of mixed-signal testing
  • Tester hardware
  • DC and parametric measurements
  • Data analysis and probability theory
  • Yield, measurement accuracy, and test time
  • DAC testing
  • ADC testing
  • Sampling theory
  • DSP-based testing
  • Analog channel testing
  • Sampled channel testing
  • Fundamentals of RF testing
  • RF test methods
  • Clock and serial data communications channel measurements
  • Tester interfacing--DIB design
  • Design for test (DfT).

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