ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

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Bibliographic Details
Corporate Authors International Symposium for Testing and Failure Analysis San Jose, Calif., Electronic Device Failure Analysis Society, International Symposium for Testing and Failure Analysis/2011, ASM International
Format Electronic eBook
LanguageEnglish
Published Materials Park, OH : ASM International, 2011.
Subjects
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
elektronické knihy
electronic books
Online AccessFull text
ISBN9781615038503
1615038507
9781680155112
1680155113
9781615038268
1615038264
0615038264
Physical Description1 online resource (xix, 456 pages) : illustrations

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Item Description:Some online versions lack accompanying media packaged with the printed version.
Bibliography:Includes bibliographical references and index.
ISBN:9781615038503
1615038507
9781680155112
1680155113
9781615038268
1615038264
0615038264
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
Physical Description:1 online resource (xix, 456 pages) : illustrations

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