Developments in surface contamination and cleaning Volume four, Detection, characterization, and analysis of contaminants /

In this series Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or handling the consequences of surface contam...

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Bibliographic Details
Other Authors Kohli, Rajiv, 1947-, Mittal, K. L., 1945-
Format Electronic eBook
LanguageEnglish
Published Amsterdam : William Andrew, 2012.
Edition1st ed.
Subjects
Surfaces (Technology) > Inspection.
Surface contamination > Prevention.
Cleaning.
Coatings.
Dust control.
elektronické knihy
electronic books
Online AccessFull text
ISBN9781437778847
1437778844
1437778836
9781437778830
9781283293792
128329379X
Physical Description1 online resource (xiii, 340 pages) : illustrations

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Table of Contents:
  • Front Cover; Developments in Surface Contamination and Cleaning; Copyright; Contents; Preface; About the Editors; Contributors; Chapter 1
  • Basics and Sampling of Particles for Size Analysis and Identification; 1.Introduction and basics; 2.Sampling; 3.Solvents and solubility parameters; 4.Cleanroom airflows and their consideration in contamination sampling; 5.Summary; References; Chapter 2
  • Computational Fluid Dynamics of Particle Transport and Deposition; 1 Introduction; 2 Formulation; 3 Applications; 4 Conclusions; Acknowledgments; References
  • Chapter 3
  • Methods for Monitoring and Measuring Cleanliness of Surfaces1 Introduction; 2 Types of Contaminants; 3 Product Cleanliness Levels; 4 Methods for Monitoring Surface Cleanliness; 5 Summary; Disclaimer; Acknowledgment; References; Chapter 4
  • Size Analysis and Identification of Particles; 1 Introduction; 2 Particle Identification; 3 Summary; References; Chapter 5
  • Developments in Imaging and Analysis Techniques for Micro- and Nanosize Particles and Surface Features; 1 Introduction; 2 Impact of Contaminants; 3 Nature and Size of Particles
  • 4 Recent Developments in Characterization Techniques5 Miscellaneous Innovative Applications of Characterization Methods; 6 Summary; Disclaimer; References; Chapter 6
  • Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions; 1 Introduction; 2 AFM
  • Modes of Operation; 3 Adhesion Forces; 4 Application of AFM; 5 Summary; References; Index

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