RF and microwave modeling and measurement techniques for compound field effect transistors

"This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, red...

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Bibliographic Details
Main Author: Gao, Jianjun, 1968-
Format: eBook
Language: English
Published: Raleigh, NC : SciTech Pub., ©2010.
Subjects:
Field-effect transistors > Testing.
Compound semiconductors > Testing.
Field-effect transistors > Mathematical models.
Compound semiconductors > Mathematical models.
Microwave measurements.
Radio measurements.
elektronické knihy
electronic books
ISBN: 9781613442869
1613442866
9781613530900
1613530900
9781891121890
1891121898
Physical Description: 1 online resource (x, 339 pages) : illustrations

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Table of contents

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007 cr cn|||||||||
008 111115s2010 ncua ob 001 0 eng d
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020 |a 9781613442869  |q (electronic bk.) 
020 |a 1613442866  |q (electronic bk.) 
020 |a 9781613530900  |q (electronic bk.) 
020 |a 1613530900  |q (electronic bk.) 
020 |z 9781891121890 
020 |z 1891121898 
035 |a (OCoLC)760985227  |z (OCoLC)842936688  |z (OCoLC)854971711  |z (OCoLC)1065685334 
100 1 |a Gao, Jianjun,  |d 1968-  |1 https://id.oclc.org/worldcat/entity/E39PCjHF99bDKTc839fFFTYfhd 
245 1 0 |a RF and microwave modeling and measurement techniques for compound field effect transistors /  |c Jianjun Gao. 
246 1 4 |a RF and microwave modeling and measurement techniques for field effect transistors 
260 |a Raleigh, NC :  |b SciTech Pub.,  |c ©2010. 
300 |a 1 online resource (x, 339 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
505 0 |a Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a "This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--Pub. desc. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Field-effect transistors  |x Testing. 
650 0 |a Compound semiconductors  |x Testing. 
650 0 |a Field-effect transistors  |x Mathematical models. 
650 0 |a Compound semiconductors  |x Mathematical models. 
650 0 |a Microwave measurements. 
650 0 |a Radio measurements. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
776 0 8 |i Print version:  |a Gao, Jianjun, 1968-  |t RF and microwave modeling and measurement techniques for compound field effect transistors.  |d Raleigh, NC : SciTech Pub., ©2010  |z 9781891121890  |w (DLC) 2009017804  |w (OCoLC)320621684 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpRFMMMTCH/rf-and-microwave?kpromoter=marc  |y Full text 

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