Extended defects in semiconductors : electronic properties, device effects and structures

"This book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices and techniques f...

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Bibliographic Details
Main Author: Holt, D. B.
Other Authors: Yacobi, B. G.
Format: eBook
Language: English
Published: Cambridge ; New York : Cambridge University Press, 2007.
Series: Knovel Library.
Subjects:
Semiconductors > Defects.
elektronické knihy
electronic books
ISBN: 9780511276880
0511276885
9780511279287
0511279280
0521819342
9780521819343
0511278683
9780511278686
0511321716
9780511321719
9780511534850
051153485X
9781107424142
1107424143
Physical Description: 1 online resource (xi, 631 pages) : illustrations

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Table of contents

LEADER 03419cam a2200517 a 4500
001 kn-ocn701832671
003 OCoLC
005 20240717213016.0
006 m o d
007 cr cn|||||||||
008 110215s2007 enka ob 001 0 eng d
040 |a KNOVL  |b eng  |e pn  |c KNOVL  |d OCLCQ  |d DEBSZ  |d OCLCQ  |d N$T  |d YDXCP  |d UAB  |d E7B  |d IDEBK  |d OCLCQ  |d KNOVL  |d ZCU  |d KNOVL  |d OCLCF  |d KNOVL  |d OCLCQ  |d VT2  |d OCLCQ  |d BUF  |d OCLCQ  |d CEF  |d RRP  |d AU@  |d OCLCO  |d WYU  |d YOU  |d ERF  |d UHL  |d S2H  |d OCLCO  |d OCLCQ  |d OCLCA  |d BRF  |d MM9  |d LUN  |d UKAHL  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCL  |d INARC  |d SXB 
020 |a 9780511276880  |q (electronic bk.) 
020 |a 0511276885  |q (electronic bk.) 
020 |a 9780511279287  |q (electronic bk.) 
020 |a 0511279280  |q (electronic bk.) 
020 |a 0521819342  |q (cloth) 
020 |a 9780521819343  |q (cloth) 
020 |a 0511278683  |q (electronic bk.) 
020 |a 9780511278686  |q (electronic bk.) 
020 |a 0511321716  |q (e-book) 
020 |a 9780511321719  |q (e-book) 
020 |a 9780511534850  |q (ebook) 
020 |a 051153485X 
020 |a 9781107424142  |q (paperback) 
020 |a 1107424143 
035 |a (OCoLC)701832671  |z (OCoLC)169906912  |z (OCoLC)213380347  |z (OCoLC)648213511  |z (OCoLC)961887527  |z (OCoLC)988711808  |z (OCoLC)999408898  |z (OCoLC)1058033325  |z (OCoLC)1065672480  |z (OCoLC)1113454729  |z (OCoLC)1167186146  |z (OCoLC)1424697570 
100 1 |a Holt, D. B. 
245 1 0 |a Extended defects in semiconductors :  |b electronic properties, device effects and structures /  |c D.B. Holt, B.G. Yacobi. 
260 |a Cambridge ;  |a New York :  |b Cambridge University Press,  |c 2007. 
300 |a 1 online resource (xi, 631 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
505 0 |a 1. Semiconducting materials; 2. An introduction to extended defects; 3. Characterization of extended defects in semiconductors; 4. Core structures and mechanical effects of extended defects specific to semiconductors; 5. The electrical, optical and device effects of dislocations and grain boundaries; 6. Point defect materials problems. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 1 |a "This book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices and techniques for their characterization are discussed. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics."--Jacket. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Semiconductors  |x Defects. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Yacobi, B. G. 
776 0 8 |i Print version:  |a Holt, D.B.  |t Extended defects in semiconductors.  |d Cambridge ; New York : Cambridge University Press, 2007  |z 9780521819343  |w (DLC) 2006037298  |w (OCoLC)76167306 
830 0 |a Knovel Library. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpEDSEPDE1/extended-defects-in?kpromoter=marc  |y Full text 

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