Extended defects in semiconductors : electronic properties, device effects and structures

• Main Author: Holt, D. B.
• Other Authors: Yacobi, B. G.
• Format: eBook
• Language: English
• Published: Cambridge ; New York : Cambridge University Press, 2007.
• Series: Knovel Library.
• Subjects: Semiconductors > Defects.; elektronické knihy; electronic books
• ISBN: 9780511276880; 0511276885; 9780511279287; 0511279280; 0521819342; 9780521819343; 0511278683; 9780511278686; 0511321716; 9780511321719; 9780511534850; 051153485X; 9781107424142; 1107424143
• Physical Description: 1 online resource (xi, 631 pages) : illustrations
• Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty

"This book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices and techniques for their characterization are discussed. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics."--Jacket.