Reliability and radiation effects in compound semiconductors

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...

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Bibliographic Details
Main Author: Johnston, Allan
Format: eBook
Language: English
Published: Singapore ; Hackensack, NJ : World Scientific, ©2010.
Subjects:
Compound semiconductors > Reliability.
Compound semiconductors > Effect of radiation on.
elektronické knihy
electronic books
ISBN: 9781615836871
161583687X
9789814277112
9814277118
981427710X
9789814277105
Physical Description: 1 online resource (xii, 363 pages) : illustrations

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Table of contents

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020 |a 9781615836871  |q (electronic bk.) 
020 |a 161583687X  |q (electronic bk.) 
020 |a 9789814277112 
020 |a 9814277118 
020 |a 981427710X 
020 |a 9789814277105 
035 |a (OCoLC)701731809  |z (OCoLC)738434092  |z (OCoLC)1086523031 
100 1 |a Johnston, Allan  |q (Allan H.)  |1 https://id.oclc.org/worldcat/entity/E39PCjxtpJhgkYwqGQFyMQR7Vy 
245 1 0 |a Reliability and radiation effects in compound semiconductors /  |c Allan Johnston. 
260 |a Singapore ;  |a Hackensack, NJ :  |b World Scientific,  |c ©2010. 
300 |a 1 online resource (xii, 363 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references (page 356) and index. 
505 0 |a Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Compound semiconductors  |x Reliability. 
650 0 |a Compound semiconductors  |x Effect of radiation on. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
776 0 8 |i Print version:  |a Johnston, Allan (Allan H.).  |t Reliability and radiation effects in compound semiconductors.  |d Singapore ; Hackensack, NJ : World Scientific, ©2010  |z 9789814277105  |w (OCoLC)311763222 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpRRECS002/reliability-and-radiation?kpromoter=marc  |y Full text 

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