Reliability and radiation effects in compound semiconductors
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...
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| Main Author: | |
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| Format: | eBook |
| Language: | English |
| Published: |
Singapore ; Hackensack, NJ :
World Scientific,
©2010.
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| Subjects: | |
| ISBN: | 9781615836871 161583687X 9789814277112 9814277118 981427710X 9789814277105 |
| Physical Description: | 1 online resource (xii, 363 pages) : illustrations |
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| Summary: | This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates. |
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| Bibliography: | Includes bibliographical references (page 356) and index. |
| ISBN: | 9781615836871 161583687X 9789814277112 9814277118 981427710X 9789814277105 |
| Access: | Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty |
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