Optical scattering : measurement and analysis

As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentat...

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Bibliographic Details
Main Author: Stover, John C.
Corporate Author: Society of Photo-Optical Instrumentation Engineers.
Format: eBook
Language: English
Published: Bellingham, Wash., USA : SPIE Optical Engineering Press, ©1995.
Edition: 2nd ed.
Series: SPIE monograph ; PM24.
Subjects:
Light > Scattering.
elektronické knihy
electronic books
ISBN: 9781615837397
1615837396
9780819419347
0819419346
9780819478443
081947844X
0819477761
9780819477767
Physical Description: 1 online resource (xiii, 321 pages) : illustrations

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Summary: As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable.
Bibliography: Includes bibliographical references (pages 303-317) and index.
ISBN: 9781615837397
1615837396
9780819419347
0819419346
9780819478443
081947844X
0819477761
9780819477767
Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty

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