Value analysis tear-down : a new process for product development and innovation

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Bibliographic Details
Main Author Sato, Yoshihiko
Other Authors Kaufman, J. Jerry
Format Electronic eBook
LanguageEnglish
Published New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edition1st ed.
Subjects
Online AccessFull text
ISBN9781615835799
1615835792
9780831132033
0831132035
Physical Description1 online resource (x, 206 pages) : illustrations

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Bibliography:Includes bibliographical references (page 199) and index.
ISBN:9781615835799
1615835792
9780831132033
0831132035
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
Physical Description:1 online resource (x, 206 pages) : illustrations