Measurement technology and intelligent instruments IX : selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia
This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, indus...
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| Corporate Author | |
|---|---|
| Other Authors | |
| Format | Electronic eBook |
| Language | English |
| Published |
Stafa-Zuerich ; Enfield, NH :
Trans Tech Publications,
©2010.
|
| Series | Key engineering materials ;
v. 437. |
| Subjects | |
| Online Access | Full text |
| ISBN | 9781613447161 1613447167 9783038133551 3038133558 0878492739 9780878492732 |
| ISSN | 1013-9826 ; |
| Physical Description | 1 online resource (xx, 656 pages) : illustrations |
Cover
Table of Contents:
- Measurement Technology and Intelligent Instruments IX; Preface; Sponsors and Committees; List of Reviewers; Table of Contents; I. General Problems of Measurement; Principles of Bayesian Methods in Data Analysis; Dynamic Pressure Calibration of Pressure Sensors Using Liquid Step Pressure Generator; Topical Tasks of Metrology due to Measuring Instruments Computerization; Multivariant System of Perspectives; II. Micro- / Nanomeasurements and Metrology; Coherent Optical Method for Studies of Nanoscale Objects in Liquid Media Based upon Spatial Averaging of Data.
- Measurement and Visualization of Dynamics of Piezoelectric MicrocantileverMicrorelief Measurements for White-Light Interferometer with Adaptive Algorithm Interferogram Processing; Model-Based Correction of Image Distortion in Scanning Electron Microscopy; Motif Parameters Based Characterization of Line Edge Roughness of a Nanoscale Grating Structure; Nanorelief Measurements Errors for a White-Light Interferometer with Chromatic Aberrations; Fabrication of Large Grating by Monitoring the Latent Fringe Pattern; Design and Analysis of a 6-DOF Monolithic Nanopositioning Stage.
- In Situ Mechanical Property Measurement of Titania NanowiresIII. Optical and X-Ray Tomography and Interferometry; Computed Tomography for Application in Manufacturing Metrology; Achieving Traceability of Industrial Computed Tomography; Developments in Homodyne Interferometry; Development of Innovative Fringe Locking Strategies for Vibration-Resistant White Light Vertical Scanning Interferometry (VSI); Compensation of Tilt Angles and Verification of Displacement Measurements with a Fabry-Perot Interferometer.
- A Compact Signal Processing with Position Sensitive Detectors Utilized for Michelson InterferometerImprovement on Measuring Optical Nonlinear Phase Shift by Self-Aligned Interferometer ; Programmable Holographic Optical Elements as Adaptive Optics in Optical Diagnostics Devices; High-Resolution Dimensional Metrology for Industrial Applications; IV. Measurements for Geometrical and Mechanical Quantities; Traceability for Areal Surface Texture Measurement; Industrial Applications of Image Based Measurement Techniques in Aerodynamics
- Problems, Progress and Future Needs.
- Development of a Print-Through Phenomenon Measurement System Using the Fringe Reflection Method for the Fiber Reinforced PlasticsMicro Coordinate Measuring Machine for Parallel Measurement of Microstructures; Machine Vision for Surface Roughness Assessment of Inclined Components; Fractal Geometry Surface Modeling and Measurement for Musical Cymbal Surface Texture Design and Rapid Manufacturing; Final Results of the Geometrical Calibration of the Pressure Balances to be Used for the new Determination of the Boltzmann Constant; 3D Inspection of Fuel Assembly Components.