Atomic force microscopy in process engineering : introduction to AFM for improved processes and products
Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...
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| Other Authors | , |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Oxford ; Burlington, MA :
Butterworth-Heinemann,
©2009.
|
| Edition | 1st ed. |
| Series | Butterworth-Heinemann/IChemE series.
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9780080949574 0080949576 9781856175173 1856175170 |
| Physical Description | 1 online resource (xvi, 283 pages) : illustrations |
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| 020 | |a 9781856175173 |q (Cloth) | ||
| 020 | |a 1856175170 |q (Cloth) | ||
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| 042 | |a dlr | ||
| 245 | 0 | 0 | |a Atomic force microscopy in process engineering : |b introduction to AFM for improved processes and products / |c [edited by] W. Richard Bowen and Nidal Hilal. |
| 250 | |a 1st ed. | ||
| 260 | |a Oxford ; |a Burlington, MA : |b Butterworth-Heinemann, |c ©2009. | ||
| 300 | |a 1 online resource (xvi, 283 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Butterworth-Heinemann/IChemE series | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal. | |
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
| 520 | |a Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to practising engineers, those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject. | ||
| 590 | |a Knovel |b Knovel (All titles) | ||
| 650 | 0 | |a Atomic force microscopy. | |
| 650 | 0 | |a Production engineering. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 700 | 1 | |a Bowen, W. Richard. |1 https://id.oclc.org/worldcat/entity/E39PCjDqGYHJJqtjW7XvtJXYWC | |
| 700 | 1 | |a Hilal, Nidal. |1 https://id.oclc.org/worldcat/entity/E39PCjyMjxrdqkQ6dtypFHk99P | |
| 776 | 0 | 8 | |i Print version: |t Atomic force microscopy in process engineering. |b 1st ed. |d Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009 |z 9781856175173 |w (OCoLC)311788904 |
| 776 | 0 | 8 | |i Online version: |t Atomic force microscopy in process engineering. |b 1st ed. |d Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009 |w (OCoLC)1017749838 |
| 830 | 0 | |a Butterworth-Heinemann/IChemE series. | |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpAFMPEAI2/atomic-force-microscopy?kpromoter=marc |y Full text |