Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

• Corporate Author: Institution of Engineering and Technology
• Other Authors: Sun, Yichuang (Editor)
• Format: Electronic eBook
• Language: English
• Published: London : Institution of Engineering and Technology, 2008.
• Series: IET circuits, devices and systems series ; 19.
• Subjects: Linear integrated circuits > Testing.; Mixed signal circuits > Testing.; Radio frequency integrated circuits > Testing.; elektronické knihy; electronic books
• ISBN: 9780863419997; 0863419992; 9781615833153; 1615833153; 9780863417450; 0863417450
• Physical Description: 1 online resource (xx, 389 pages) : illustrations

Annotation

Table of Contents:

• Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun
• Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli
• Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He
• Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd
• DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts
• Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan
• Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson
• Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda
• Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson
• On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio
• Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.