rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Test and diagnosis of analogue, mixed-signal and RF integrated circuits
    sub title: the system on chip approach
  name:
    name part: Sun, Yichuang.
    role:
      role term: edt
  name:
    name part: Institution of Engineering and Technology
  type of resource: text
  genre: bibliography
  genre: elektronické knihy
  genre: electronic books
  origin info:
    place:
      place term: enk
    place:
      place term: London
    publisher: Institution of Engineering and Technology
    date issued: 2008
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xx, 389 pages) : illustrations
  abstract: Annotation This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. It contains eleven chapters by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
  table of contents: Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.
  note: edited by Yichuang Sun.
  note: Title from title screen.
  note: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
  note: Includes bibliographical references and index.
  subject:
    topic: Linear integrated circuits
    topic: Testing
  subject:
    topic: Mixed signal circuits
    topic: Testing
  subject:
    topic: Radio frequency integrated circuits
    topic: Testing
  related item:
    title info:
      title: Test and diagnosis of analogue, mixed-signal and RF integrated circuits
    origin info:
      publisher: London : Institution of Engineering and Technology, 2008
    identifier: (OCoLC)180473599
  related item:
    title info:
      title: IET circuits, devices and systems series ; 19
  identifier: 9780863419997
  identifier: 0863419992
  identifier: 9781615833153
  identifier: 1615833153
  identifier: 9780863417450
  identifier: 0863417450
  identifier: https://proxy.k.utb.cz/login
  access condition: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
  record info:
    record content source: CtWfDGI
    record creation date: 081106
    record change date: 20240717213016.0
    record identifier: kn-ocn456124034
    language of cataloging:
      language term: eng