http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Test and diagnosis of analogue, mixed-signal and RF integrated circuits
Institution of Engineering and Technology
1 online resource (xx, 389 pages) : illustrations
Annotation This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. It contains eleven chapters by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun.
Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
Includes bibliographical references and index.
London : Institution of Engineering and Technology, 2008
IET circuits, devices and systems series ; 19