Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

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Bibliographic Details
Corporate Author: Institution of Engineering and Technology.
Other Authors: Sun, Yichuang. (Editor)
Format: eBook
Language: English
Published: London : Institution of Engineering and Technology, 2008.
Series: IET circuits, devices and systems series ; 19.
Subjects:
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
elektronické knihy
electronic books
ISBN: 9780863419997
0863419992
9781615833153
1615833153
9780863417450
0863417450
Physical Description: 1 online resource (xx, 389 pages) : illustrations

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Table of contents

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008 081106s2008 enka ob 001 0 eng d
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020 |a 9780863419997  |q (electronic bk.) 
020 |a 0863419992  |q (electronic bk.) 
020 |a 9781615833153  |q (electronic bk.) 
020 |a 1615833153  |q (electronic bk.) 
020 |z 9780863417450 
020 |z 0863417450 
035 |a (OCoLC)456124034  |z (OCoLC)424642044  |z (OCoLC)623468726  |z (OCoLC)646795920  |z (OCoLC)650987986  |z (OCoLC)712981930  |z (OCoLC)961879283  |z (OCoLC)988692949  |z (OCoLC)994979555  |z (OCoLC)999474246  |z (OCoLC)1058085541  |z (OCoLC)1058505476  |z (OCoLC)1062909114 
245 0 0 |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits :  |b the system on chip approach /  |c edited by Yichuang Sun. 
260 |a London :  |b Institution of Engineering and Technology,  |c 2008. 
300 |a 1 online resource (xx, 389 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Circuits, devices and systems series ;  |v 19 
500 |a Title from title screen. 
504 |a Includes bibliographical references and index. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 8 |a Annotation  |b This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. It contains eleven chapters by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students. 
505 0 |a Fault diagnosis of linear and non-linear analogue circuits / Yichuang Sun -- Symbolic function approaches for analogue fault diagnosis / Stefano Manetti and Maria Cristina Piccirilli -- Neural-network-based approaches for analogue circuit fault diagnosis / Yichuang Sun and Yigang He -- Hierarchical/decomposition techniques for large-scale analogue diagnosis / Peter Shepherd -- DFT and BIST techniques for analogue and mixed-signal test / Mona Safi-Harb and Gordon Roberts -- Design-for-testability of analogue filters / Yichuang Sun and Masood-ul Hasan -- Test of A/D converters: from converter characteristics to built-in self-test proposals / Andreas Lechner and Andrew Richardson -- Test of [Sigma Delta] converters / Gildas Leger and Adoracion Rueda -- Phase-locked loop test methodologies: current characterization and production test practices / Martin John Burbidge and Andrew Richardson -- On-chip testing techniques for RF wirless transceiver systems and components / Alberto Valdes-Garcia, Jose Silva-Martinez, Edgar Sanchez-Sinencio -- Tuning and calibration of analogue, mixed-signal and RF circuits / James Moritz and Yichuang Sun. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Linear integrated circuits  |x Testing. 
650 0 |a Mixed signal circuits  |x Testing. 
650 0 |a Radio frequency integrated circuits  |x Testing. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Sun, Yichuang.  |4 edt 
710 2 |a Institution of Engineering and Technology. 
776 0 8 |i Print version:  |t Test and diagnosis of analogue, mixed-signal and RF integrated circuits.  |d London : Institution of Engineering and Technology, 2008  |z 9780863417450  |w (OCoLC)180473599 
830 0 |a IET circuits, devices and systems series ;  |v 19. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpTDAMSRF1/test-and-diagnosis?kpromoter=marc  |y Full text 

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