Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach

• Corporate Author: Institution of Engineering and Technology
• Other Authors: Sun, Yichuang (Editor)
• Format: Electronic eBook
• Language: English
• Published: London : Institution of Engineering and Technology, 2008.
• Series: IET circuits, devices and systems series ; 19.
• Subjects: Linear integrated circuits > Testing.; Mixed signal circuits > Testing.; Radio frequency integrated circuits > Testing.; elektronické knihy; electronic books
• ISBN: 9780863419997; 0863419992; 9781615833153; 1615833153; 9780863417450; 0863417450
• Physical Description: 1 online resource (xx, 389 pages) : illustrations
• Item Description: Title from title screen.
• Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty

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