Architecture design for soft errors

• Main Author: Mukherjee, Shubu.
• Format: eBook
• Language: English
• Published: Amsterdam ; Boston : Morgan Kaufmann Publishers/Elsevier, ©2008.
• Subjects: Integrated circuits.; Integrated circuits > Effect of radiation on.; Computer architecture.; System design.; Computer systems > Reliability.; Computers > Reliability.; Integrated circuits > Fault tolerance.; Fault-tolerant computing.; elektronické knihy; electronic books
• ISBN: 9780123695291; 0123695295; 9780080558325; 0080558321; 1281272760; 9781281272768; 9786611272760; 6611272763
• Physical Description: 1 online resource (xxi, 337 pages) : illustrations
• Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty

This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them.