Properties of crystalline silicon

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Bibliographic Details
Corporate Author INSPEC (Information service)
Other Authors Hull, Robert, 1959-
Format Electronic eBook
LanguageEnglish
Published London : INSPEC, the Institution of Electrical Engineers, ©1999.
SeriesEMIS datareviews series ; no. 20.
Subjects
Silicon.
elektronické knihy
electronic books
Online AccessFull text
ISBN159124871X
9781591248712
0852969333
9780852969335
Physical Description1 online resource (xxvi, 1016 pages) : illustrations

Cover

Table of Contents:
  • Melt growth / edited by T. Abe
  • Epitacxial growth / edited by J.C. Bean
  • Structural and mechanical properties / edited by A. George
  • Thermal properties / edited by M.R. Brozel
  • Surface properties and cleaning / edited by R.J. Nemanich
  • Structural modelling / edited by M. Heggie
  • Band structure / edited by R.J. Turton
  • Electrical properties / edited by S.H. Jones
  • Impurities in silicon / edited by S.J. Pearson
  • Dopants in silicon / edited by K. Jones
  • Defect levels in silicon / edited by H. Godfrey
  • Optical properties / edited by D.E. Aspnes
  • Photoconductivity and photogenerated carriers / edited by M. Willander
  • Implantation/irradiation of silicon / edited by R. Elliman
  • Gettering / edited by E.R. Weber
  • Etching / edited by K.R. Williams
  • Metal-silicon contacts / edited by L. Schowalter
  • Silicon on insulator technology / edited by S.S. Iyer.

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