Properties of crystalline silicon
Saved in:
| Corporate Author | |
|---|---|
| Other Authors | |
| Format | Electronic eBook |
| Language | English |
| Published |
London :
INSPEC, the Institution of Electrical Engineers,
©1999.
|
| Series | EMIS datareviews series ;
no. 20. |
| Subjects | |
| Online Access | Full text |
| ISBN | 159124871X 9781591248712 0852969333 9780852969335 |
| Physical Description | 1 online resource (xxvi, 1016 pages) : illustrations |
Cover
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | kn-ocm62205108 | ||
| 003 | OCoLC | ||
| 005 | 20240717213016.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 051102s1999 enka ob 001 0 eng d | ||
| 040 | |a KNOVL |b eng |e pn |c KNOVL |d MYG |d OCLCQ |d KNOVL |d ZCU |d OCLCF |d KNOVL |d OCLCO |d KNOVL |d OCLCQ |d OCLCE |d UWW |d OCLCQ |d RRP |d AU@ |d S2H |d OCLCO |d OCLCQ |d OCLCO |d OCLCL |d SXB | ||
| 020 | |a 159124871X |q (electronic bk.) | ||
| 020 | |a 9781591248712 |q (electronic bk.) | ||
| 020 | |a 0852969333 | ||
| 020 | |a 9780852969335 | ||
| 035 | |a (OCoLC)62205108 |z (OCoLC)300638758 |z (OCoLC)607381047 |z (OCoLC)639758977 |z (OCoLC)977040783 |z (OCoLC)1058059932 | ||
| 042 | |a dlr | ||
| 245 | 0 | 0 | |a Properties of crystalline silicon / |c edited by Robert Hull. |
| 260 | |a London : |b INSPEC, the Institution of Electrical Engineers, |c ©1999. | ||
| 300 | |a 1 online resource (xxvi, 1016 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a EMIS datareviews series ; |v no. 20 | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 2 | 0 | |t Melt growth / |r edited by T. Abe -- |t Epitacxial growth / |r edited by J.C. Bean -- |t Structural and mechanical properties / |r edited by A. George -- |t Thermal properties / |r edited by M.R. Brozel -- |t Surface properties and cleaning / |r edited by R.J. Nemanich -- |t Structural modelling / |r edited by M. Heggie -- |t Band structure / |r edited by R.J. Turton -- |t Electrical properties / |r edited by S.H. Jones -- |t Impurities in silicon / |r edited by S.J. Pearson -- |t Dopants in silicon / |r edited by K. Jones -- |t Defect levels in silicon / |r edited by H. Godfrey -- |t Optical properties / |r edited by D.E. Aspnes -- |t Photoconductivity and photogenerated carriers / |r edited by M. Willander -- |t Implantation/irradiation of silicon / |r edited by R. Elliman -- |t Gettering / |r edited by E.R. Weber -- |t Etching / |r edited by K.R. Williams -- |t Metal-silicon contacts / |r edited by L. Schowalter -- |t Silicon on insulator technology / |r edited by S.S. Iyer. |
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
| 590 | |a Knovel |b Knovel (All titles) | ||
| 650 | 0 | |a Silicon. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 700 | 1 | |a Hull, Robert, |d 1959- |1 https://id.oclc.org/worldcat/entity/E39PCjrY74QPjWXB6v4rGPbwyb | |
| 710 | 2 | |a INSPEC (Information service) | |
| 776 | 0 | 8 | |i Print version: |t Properties of crystalline silicon. |d London : INSPEC, the Institution of Electrical Engineers, ©1999 |z 0852969333 |w (OCoLC)41984192 |
| 830 | 0 | |a EMIS datareviews series ; |v no. 20. | |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpPCS00005/properties-of-crystalline?kpromoter=marc |y Full text |