Properties of crystalline silicon

Saved in:
Bibliographic Details
Corporate Author INSPEC (Information service)
Other Authors Hull, Robert, 1959-
Format Electronic eBook
LanguageEnglish
Published London : INSPEC, the Institution of Electrical Engineers, ©1999.
SeriesEMIS datareviews series ; no. 20.
Subjects
Online AccessFull text
ISBN159124871X
9781591248712
0852969333
9780852969335
Physical Description1 online resource (xxvi, 1016 pages) : illustrations

Cover

LEADER 00000cam a2200000 a 4500
001 kn-ocm62205108
003 OCoLC
005 20240717213016.0
006 m o d
007 cr cn|||||||||
008 051102s1999 enka ob 001 0 eng d
040 |a KNOVL  |b eng  |e pn  |c KNOVL  |d MYG  |d OCLCQ  |d KNOVL  |d ZCU  |d OCLCF  |d KNOVL  |d OCLCO  |d KNOVL  |d OCLCQ  |d OCLCE  |d UWW  |d OCLCQ  |d RRP  |d AU@  |d S2H  |d OCLCO  |d OCLCQ  |d OCLCO  |d OCLCL  |d SXB 
020 |a 159124871X  |q (electronic bk.) 
020 |a 9781591248712  |q (electronic bk.) 
020 |a 0852969333 
020 |a 9780852969335 
035 |a (OCoLC)62205108  |z (OCoLC)300638758  |z (OCoLC)607381047  |z (OCoLC)639758977  |z (OCoLC)977040783  |z (OCoLC)1058059932 
042 |a dlr 
245 0 0 |a Properties of crystalline silicon /  |c edited by Robert Hull. 
260 |a London :  |b INSPEC, the Institution of Electrical Engineers,  |c ©1999. 
300 |a 1 online resource (xxvi, 1016 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a EMIS datareviews series ;  |v no. 20 
504 |a Includes bibliographical references and index. 
505 2 0 |t Melt growth /  |r edited by T. Abe --  |t Epitacxial growth /  |r edited by J.C. Bean --  |t Structural and mechanical properties /  |r edited by A. George --  |t Thermal properties /  |r edited by M.R. Brozel --  |t Surface properties and cleaning /  |r edited by R.J. Nemanich --  |t Structural modelling /  |r edited by M. Heggie --  |t Band structure /  |r edited by R.J. Turton --  |t Electrical properties /  |r edited by S.H. Jones --  |t Impurities in silicon /  |r edited by S.J. Pearson --  |t Dopants in silicon /  |r edited by K. Jones --  |t Defect levels in silicon /  |r edited by H. Godfrey --  |t Optical properties /  |r edited by D.E. Aspnes --  |t Photoconductivity and photogenerated carriers /  |r edited by M. Willander --  |t Implantation/irradiation of silicon /  |r edited by R. Elliman --  |t Gettering /  |r edited by E.R. Weber --  |t Etching /  |r edited by K.R. Williams --  |t Metal-silicon contacts /  |r edited by L. Schowalter --  |t Silicon on insulator technology /  |r edited by S.S. Iyer. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Silicon. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Hull, Robert,  |d 1959-  |1 https://id.oclc.org/worldcat/entity/E39PCjrY74QPjWXB6v4rGPbwyb 
710 2 |a INSPEC (Information service) 
776 0 8 |i Print version:  |t Properties of crystalline silicon.  |d London : INSPEC, the Institution of Electrical Engineers, ©1999  |z 0852969333  |w (OCoLC)41984192 
830 0 |a EMIS datareviews series ;  |v no. 20. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpPCS00005/properties-of-crystalline?kpromoter=marc  |y Full text