Encyclopedia of materials characterization : surfaces, interfaces, thin films

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...

Full description

Saved in:
Bibliographic Details
Other Authors Brundle, C. R., Evans, Charles A., Wilson, Shaun
Format Electronic eBook
LanguageEnglish
Published Boston : Greenwich, CT : Butterworth-Heinemann ; Manning, ©1992.
SeriesMaterials characterization series.
Subjects
Online AccessFull text
ISBN1591245028
9781591245025
9780080523606
0080523609
0750691689
9780750691680
Physical Description1 online resource (xix, 751 pages) : illustrations

Cover

Table of Contents:
  • Introduction and summaries
  • Imaging techniques (Microscopy)
  • Electron beam instruments
  • Structure determination by diffraction and scattering
  • Electron emission spectroscopies
  • X-ray emission techniques
  • Visible/UV emission, reflection, and absorption
  • Vibrational spectroscopies and NMR
  • Ion scattering techniques
  • Mass and optical spectroscopies
  • Neutron and nuclear techniques
  • Physical and magnetic properties.