Characterization of semiconductor materials : principles and methods
Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.
Saved in:
| Other Authors | |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Park Ridge, N.J. :
Noyes Publications,
©1989-
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| Series | Materials science and process technology series.
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| Subjects | |
| Online Access | Full text |
| ISBN | 1591240271 9781591240273 9780815516347 0815516347 0815512007 9780815512004 |
| Physical Description | 1 online resource (volumes <1>) : illustrations. |
Cover
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| 042 | |a dlr | ||
| 245 | 0 | 0 | |a Characterization of semiconductor materials : |b principles and methods / |c edited by Gary E. McGuire. |
| 260 | |a Park Ridge, N.J. : |b Noyes Publications, |c ©1989- | ||
| 300 | |a 1 online resource (volumes <1>) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Materials science and process technology series | |
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
| 520 | |a Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 590 | |a Knovel |b Knovel (All titles) | ||
| 650 | 0 | |a Semiconductors |v Handbooks, manuals, etc. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 700 | 1 | |a McGuire, G. E. | |
| 776 | 0 | 8 | |i Print version: |t Characterization of semiconductor materials. |d Park Ridge, N.J. : Noyes Publications, ©1989- |z 0815512007 |w (DLC) 89030273 |w (OCoLC)19221501 |
| 830 | 0 | |a Materials science and process technology series. | |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpCSMPMV01/characterization-of-semiconductor?kpromoter=marc |y Full text |