Characterization of semiconductor materials : principles and methods
Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.
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Other Authors: | |
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Format: | eBook |
Language: | English |
Published: |
Park Ridge, N.J. :
Noyes Publications,
©1989-
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Series: | Materials science and process technology series.
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Subjects: | |
ISBN: | 1591240271 9781591240273 9780815516347 0815516347 0815512007 9780815512004 |
Physical Description: | 1 online resource (volumes <1>) : illustrations. |
Summary: | Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions. |
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Bibliography: | Includes bibliographical references and index. |
ISBN: | 1591240271 9781591240273 9780815516347 0815516347 0815512007 9780815512004 |
Access: | Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty |