Handbook of thin-film deposition processes and techniques : principles, methods, equipment and applications

The 2nd edition contains new chapters on contamination and contamination control that describe the basics and the issues. Another new chapter on meteorology explains the growth of sophisticated, automatic tools capable of measuring thickness and spacing of sub-micron dimensions. The book also covers...

Full description

Saved in:
Bibliographic Details
Other Authors: Seshan, Krishna.
Format: eBook
Language: English
Published: Norwich, N.Y. : Noyes Publications/William Andrew Pub., ©2002.
Edition: 2nd ed.
Series: Materials science and process technology series. Electronic materials and process technology.
Subjects:
ISBN: 1591241936
9781591241935
9780815517788
0815517785
9780815517764
0815517769
9780815514428
0815514425
0429076746
9780429076749
1482269686
9781482269680
1282253190
9781282253193
9786612253195
6612253193
9786612253188
6612253185
Physical Description: 1 online resource (xxviii, 629 pages) : illustrations.

Cover

Table of contents

LEADER 04705cam a2200601Ma 4500
001 kn-ocm49708503
003 OCoLC
005 20240717213016.0
006 m o d
007 cr cn|||||||||
008 020123s2002 nyua obf 001 0 eng d
040 |a KNOVL  |b eng  |e pn  |c KNOVL  |d OCLCQ  |d TEF  |d OCLCQ  |d SHH  |d OCLCQ  |d VLB  |d OPELS  |d N$T  |d YDXCP  |d UBY  |d UWW  |d IDEBK  |d AU@  |d E7B  |d QE2  |d B24X7  |d OCLCQ  |d KNOVL  |d OCLCO  |d ZCU  |d KNOVL  |d OCLCF  |d COO  |d OCLCQ  |d KNOVL  |d OCL  |d OCLCQ  |d TEF  |d VT2  |d OCLCQ  |d UAB  |d BUF  |d D6H  |d YDX  |d OCLCQ  |d CEF  |d RRP  |d WYU  |d LEAUB  |d S9I  |d UKAHL  |d SFB  |d EYM  |d COM  |d OCLCO  |d OCLCQ  |d OCLCO  |d OCLCL  |d OCLCQ 
020 |a 1591241936  |q (electronic bk.) 
020 |a 9781591241935  |q (electronic bk.) 
020 |a 9780815517788  |q (electronic bk.) 
020 |a 0815517785  |q (electronic bk.) 
020 |a 9780815517764  |q (electronic bk.) 
020 |a 0815517769  |q (electronic bk.) 
020 |z 9780815514428 
020 |z 0815514425 
020 |a 0429076746 
020 |a 9780429076749 
020 |a 1482269686 
020 |a 9781482269680 
020 |a 1282253190 
020 |a 9781282253193 
020 |a 9786612253195 
020 |a 6612253193 
020 |a 9786612253188 
020 |a 6612253185 
035 |a (OCoLC)49708503  |z (OCoLC)49411049  |z (OCoLC)271043837  |z (OCoLC)281603397  |z (OCoLC)303292812  |z (OCoLC)471136041  |z (OCoLC)505118548  |z (OCoLC)647800831  |z (OCoLC)961882799  |z (OCoLC)988680198  |z (OCoLC)993527864  |z (OCoLC)999450173  |z (OCoLC)999656345  |z (OCoLC)1057991868  |z (OCoLC)1060196248  |z (OCoLC)1065847401  |z (OCoLC)1105855333  |z (OCoLC)1136371819  |z (OCoLC)1194777210 
245 0 0 |a Handbook of thin-film deposition processes and techniques :  |b principles, methods, equipment and applications /  |c edited by Krishna Seshan. 
250 |a 2nd ed. 
260 |a Norwich, N.Y. :  |b Noyes Publications/William Andrew Pub.,  |c ©2002. 
300 |a 1 online resource (xxviii, 629 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Materials science and process technology series. Electronic materials and process technology 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a The 2nd edition contains new chapters on contamination and contamination control that describe the basics and the issues. Another new chapter on meteorology explains the growth of sophisticated, automatic tools capable of measuring thickness and spacing of sub-micron dimensions. The book also covers PVD, laser and e-beam assisted deposition, MBE, and ion beam methods to bring together physical vapor deposition techniques. Two entirely new areas are focused on: chemical mechanical polishing, which helps attain the flatness that is required by modern lithography methods, and new materials used for interconnect dielectric materials, specifically organic polyimide materials. 
504 |a Includes bibliographical references and index. 
505 0 |a Foreword: Gordon Moore -- Recent Changes in the Semiconductor Industry -- Deposition Technologies and Applications: Introduction and Overview -- Silicon Epitaxy by Chemical Vapor Deposition -- Chemical Vapor Deposition of Silicon Dioxide Films -- Metal Organic Chemical Vapor Deposition -- Feature Scale Modeling -- The Role of Metrology and Inspection to Semiconductor Processing -- Contamination Control, Defect Detection and Yield Enhancement in Gigabit Manufacturing -- Sputtering and Sputter Deposition -- Laser and Electron Beam Assisted Processing -- Molecular Beam Epitaxy: Equipment and Practice -- Ion Beam Deposition -- Chemical Mechanical Polishing -- Organic Dielectrics in Multilevel Metallization of Integrated Circuits -- Performance, Processing, and Lithography Trends -- Index. 
590 |a Knovel  |b Knovel (All titles) 
650 0 |a Thin film devices  |x Design and construction  |v Handbooks, manuals, etc. 
650 0 |a Thin films  |v Handbooks, manuals, etc. 
650 0 |a Chemical vapor deposition  |v Handbooks, manuals, etc. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Seshan, Krishna. 
776 0 8 |i Print version:  |t Handbook of thin-film deposition processes and techniques : principles, methods, equipment and applications.  |d Norwich, N.Y. : Noyes Publications/William Andrew Pub., 2002  |z 0815514425  |w (DLC) 2001135178  |w (OCoLC)42960492 
830 0 |a Materials science and process technology series.  |p Electronic materials and process technology. 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://app.knovel.com/hotlink/toc/id:kpHTFDPTP1/handbook-of-thin?kpromoter=marc  |y Full text