Vector network analyzer (VNA) measurements and uncertainty assessment

• Main Author: Shoaib, Nosherwan (Author)
• Corporate Author: Politecnico di Torino
• Format: Electronic eBook
• Language: English
• Published: Cham, Switzerland : Springer, [2017]
• Series: PoliTO Springer series.
• Subjects: Vector analysis.; Vector processing (Computer science); Calibration.; elektronické knihy; electronic books
• ISBN: 9783319447728; 9783319447711
• ISSN: 2509-6796
• Physical Description: 1 online resource

This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes...

Table of Contents:

• Preface; Acknowledgments; Contents; 1 General Introduction; 1.1 Introduction; 1.2 VNA Architecture; 1.3 VNA Measurements; 1.3.1 Measurement Errors; 1.3.2 Calibration Standards; 1.3.3 Error Box Model; 1.3.4 Calibration Techniques; 1.4 Measurement Uncertainty; 1.4.1 Uncertainty Components Classification; 1.4.2 Representation of S-Parameter Uncertainty; References; 2 Waveguide Measurement Uncertainty; 2.1 Introduction; 2.2 Mathematical Model and Measurement Uncertainty Evaluation; 2.3 Measurands and Measurement Setup; 2.4 Dimensional Measurements; 2.5 Measurement Results; 2.6 Uncertainty Budget.
• 2.7 Discussion2.8 Conclusion; References; 3 VNA Calibration Comparison; 3.1 Introduction; 3.2 Calibration Techniques; 3.3 Measurement Uncertainty Evaluation; 3.4 Measurands and Measurement Setup; 3.5 Dimensional Characterization; 3.6 Measurement Results; 3.7 Uncertainty Budget; 3.8 Discussion; 3.9 Conclusion; References; 4 VNA Connection Repeatability Investigation; 4.1 Introduction; 4.2 Mathematical Formulation; 4.3 Experimental Setup; 4.4 Measurement Results; 4.4.1 Flush Short-Circuit Measurements; 4.4.2 Offset Short-Circuit Measurements; 4.4.3 Near-Matched Termination Measurements.
• 4.4.4 Mismatched Termination Measurements4.5 Discussions; 4.6 Conclusion; References; 5 VNA Verification Artefacts; 5.1 Introduction; 5.2 Dimensional Tolerances and Flange Misalignment; 5.3 Electromagnetic Simulations; 5.3.1 Electromagnetic Simulations for Waveguide Artefacts; 5.3.2 Electromagnetic Simulations for Coaxial Artefact; 5.4 Uncertainty Estimation; 5.5 Experimental Setup; 5.6 Results and Discussions; 5.6.1 Waveguide Verification Standards; 5.6.2 Coaxial Verification Standard; 5.7 Conclusion; References; Appendix General Conclusions; Index.