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01730nam a2200457 i 4500 |
001 |
92312 |
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CZ ZlUTB |
005 |
20240829163707.0 |
007 |
ta |
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190206s1999 xxua f f 001 0 eng d |
020 |
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|a 9781461372318
|q (brožováno)
|
040 |
|
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|a ZLD002
|b cze
|e rda
|
072 |
|
7 |
|a 621.3
|x Elektrotechnika
|2 Konspekt
|9 19
|
080 |
|
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|a 621.3.049.77
|2 MRF
|
080 |
|
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|a 621.315.59
|2 MRF
|
080 |
|
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|a 621.38:005.955.33
|2 MRF
|
080 |
|
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|a 62-027.45
|2 MRF
|
080 |
|
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|a (035)
|2 MRF
|
245 |
0 |
0 |
|a Failure analysis of integrated circuits :
|b tools and techniques /
|c edited by Lawrence C. Wagner
|
250 |
|
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|a 1st edition
|
264 |
|
1 |
|a New York :
|b Springer Science+Business Media, LLC,
|c 1999
|
300 |
|
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|a ix, 255 stran :
|b černobílé ilustrace ;
|c 24 cm
|
336 |
|
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|a text
|b txt
|2 rdacontent
|
337 |
|
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|a bez média
|b n
|2 rdamedia
|
338 |
|
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|a svazek
|b nc
|2 rdacarrier
|
504 |
|
|
|a Obsahuje bibliografie a rejstřík
|
650 |
0 |
7 |
|a integrované obvody
|7 ph114781
|2 czenas
|
650 |
0 |
7 |
|a polovodiče
|7 ph124272
|2 czenas
|
650 |
0 |
7 |
|a testování elektronických systémů
|7 ph330269
|2 czenas
|
650 |
0 |
7 |
|a spolehlivost (technika)
|7 ph125917
|2 czenas
|
650 |
0 |
9 |
|a integrated circuits
|2 eczenas
|
650 |
0 |
9 |
|a semiconductors
|2 eczenas
|
650 |
0 |
9 |
|a testing of electronic systems
|2 eczenas
|
650 |
0 |
9 |
|a reliability (engineering)
|2 eczenas
|
655 |
|
7 |
|a příručky
|7 fd133209
|2 czenas
|
655 |
|
9 |
|a handbooks and manuals
|2 eczenas
|
700 |
1 |
|
|a Wagner, Lawrence C.
|7 utb20191022997
|4 aut
|
910 |
|
|
|a ZLD002
|
992 |
|
|
|a BK
|b SK
|d 1
|
999 |
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|
|c 92312
|d 92312
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952 |
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|0 0
|1 0
|4 0
|6 6213FAILURE
|7 0
|8 BOOK
|9 149821
|a UTBZL
|b UTBZL
|c 007
|d 2019-02-06
|l 1
|m 1
|o 621.3/FAILURE
|p 420010178347
|q 2028-12-21
|r 2019-08-26
|v 2920.00
|w 2019-08-26
|x N:nákup;
|y 08
|