Failure analysis of integrated circuits : tools and techniques

• Main Author: Wagner, Lawrence C. (Author)
• Format: Book
• Language: English
• Published: New York : Springer Science+Business Media, LLC, 1999
• Edition: 1st edition
• Subjects: integrované obvody; polovodiče; testování elektronických systémů; spolehlivost (technika); integrated circuits; semiconductors; testing of electronic systems; reliability (engineering); příručky; handbooks and manuals
• ISBN: 9781461372318
• Physical Description: ix, 255 stran : černobílé ilustrace ; 24 cm