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LEADER |
01867cam a2200517 i 4500 |
001 |
89508 |
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CZ ZlUTB |
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20240829162645.0 |
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ta |
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990811s1999 si a f bf 001 0 eng |
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|a 9810223528
|q (vázáno)
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|a (DLC) 99044781
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|a DLC
|b cze
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|d ZLD002
|e rda
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044 |
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|a si
|a xxk
|a xxu
|a cc
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072 |
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7 |
|a 621.38
|x Elektronika
|2 Konspekt
|9 19
|
080 |
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|a 621.38.049.77
|2 MRF
|
080 |
|
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|a 543.422.3-74
|2 MRF
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|a 620.2:621.3
|2 MRF
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|a 535.34
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100 |
1 |
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|a Lau, W. S.,
|d 1955-
|7 utb2018983425
|4 aut
|
245 |
1 |
0 |
|a Infrared characterization for microelectronics /
|c W.S. Lau
|
264 |
|
1 |
|a Singapore ;
|a New Jersey ;
|a London ;
|a Hong Kong :
|b World Scientific,
|c [1999]
|
264 |
|
4 |
|c ©1999
|
300 |
|
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|a x, 160 stran :
|b ilustrace ;
|c 23 cm
|
336 |
|
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|a text
|b txt
|2 rdacontent
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337 |
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|a bez média
|b n
|2 rdamedia
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338 |
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|a svazek
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504 |
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|a Obsahuje bibliografie a rejstřík
|
650 |
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7 |
|a mikroelektronika
|7 ph122849
|2 czenas
|
650 |
0 |
7 |
|a infračervená spektroskopie
|7 ph318941
|2 czenas
|
650 |
0 |
7 |
|a elektrotechnické materiály
|7 ph114457
|2 czenas
|
650 |
0 |
7 |
|a zkoušení materiálů
|7 ph116776
|2 czenas
|
650 |
0 |
7 |
|a absorpční spektra
|7 ph136598
|2 czenas
|
650 |
0 |
9 |
|a microelectronics
|2 eczenas
|
650 |
0 |
9 |
|a infrared spectroscopy
|2 eczenas
|
650 |
0 |
9 |
|a electrotechnical materials
|2 eczenas
|
650 |
0 |
9 |
|a material technologies
|2 eczenas
|
650 |
0 |
9 |
|a absorption spectra
|2 eczenas
|
655 |
|
7 |
|a příručky
|7 fd133209
|2 czenas
|
655 |
|
9 |
|a handbooks and manuals
|2 eczenas
|
910 |
|
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|a ZLD002
|
992 |
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|a BK
|b SK
|d 1
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999 |
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|c 89508
|d 89508
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|6 62138LAUWS
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|8 BOOK
|9 146135
|a UTBZL
|b UTBZL
|c 041
|d 2018-02-23
|l 1
|o 621.38/LAU,W.S.
|p 420010173399
|r 2019-08-26
|v 933.00
|w 2019-08-26
|x N:nákup;
|y 08
|