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170228s2017 xxua f 001 0 eng d |
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|a Atomic force microscopy /
|c editor Armand Vance
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| 264 |
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1 |
|a New York :
|b Scitus Academics,
|c [2017]
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| 264 |
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4 |
|c ©2017
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| 300 |
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|a viii, 305 stran :
|b ilustrace ;
|c 24 cm
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|a Obsahuje bibliografie a rejstřík
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|a mikroskopie atomárních sil
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|a atomic force microscopy
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|a papers of several authors
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|a Vance, Armand
|4 edt
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