Staff View: Atomic force microscopy

Atomic force microscopy

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Bibliographic Details
Other Authors:	Vance, Armand (Editor)
Format:	Book
Language:	English
Published:	New York : Scitus Academics, [2017]
Subjects:	mikroskopie atomárních sil atomic force microscopy sborníky papers of several authors
ISBN:	9781681172125
Physical Description:	viii, 305 stran : ilustrace ; 24 cm


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