Atomic force microscopy

• Other Authors: Vance, Armand (Editor)
• Format: Book
• Language: English
• Published: New York : Scitus Academics, [2017]
• Subjects: mikroskopie atomárních sil; atomic force microscopy; sborníky; papers of several authors
• ISBN: 9781681172125
• Physical Description: viii, 305 stran : ilustrace ; 24 cm