Fundamentals of atomic force microscopy

Saved in:
Bibliographic Details
Main Author Reifenberger, Ronald G. (Author)
Format Book
LanguageEnglish
Published New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo : World Scientific, [2016]-
SeriesLessons from nanoscience
Subjects
ISBN9789814630344
978-981-4630-35-1
Physical Description^^^svazků : ilustrace ; 23 cm

Cover