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Fundamentals of atomic force microscopy

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Bibliographic Details
Main Author Reifenberger, Ronald G. (Author)
Format Book
LanguageEnglish
Published New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo : World Scientific, [2016]-
SeriesLessons from nanoscience
Subjects
atomová spektroskopie
atomic spectroscopy
učební texty
educational texts
ISBN9789814630344
978-981-4630-35-1
Physical Description^^^svazků : ilustrace ; 23 cm

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Table of Contents:
  • Part 1. Foundations
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