Fundamentals of atomic force microscopy

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Bibliographic Details
Main Author: Reifenberger, Ronald G. (Author)
Format: Book
Language: English
Published: New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo : World Scientific, [2016]-
Series: Lessons from nanoscience
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ISBN: 9789814630344
978-981-4630-35-1
Physical Description: ^^^svazků : ilustrace ; 23 cm

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Bibliography: Obsahuje bibliografické odkazy a rejstřík
ISBN: 9789814630344
978-981-4630-35-1